Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing a test substrate under defined thermal conditions and thermally conditionable prober

Method for testing a test substrate under defined thermal conditions and thermally conditionable prober

US Patent 9395411 · Granted Jul 19, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system for coordinated use of mobile radio frequencies2025
Probe system and machine apparatus thereof2025
Method and system for recording and synchronizing audio and video signals and au2023
Method and system for coordinated use of mobile radio frequencies2022
Method for compensating to distance between probe tip and device under test afte2022
Wafer probe station2022
Control method of touch display apparatus2021
Display method of display apparatus2021
Method for operating at least one mobile radio device, power supply unit for mob2021
Wafer probe station2021
Probe systems and methods that utilize a flow-regulating structure for improved 2020
Carrier device for attachment to a pane of a motor vehicle and motor vehicle2020