Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for controlling the temperature of electronic components

Method and apparatus for controlling the temperature of electronic components

US Patent 7671615 · Granted Mar 2, 2010

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe system and machine apparatus thereof2025
Motorized chuck stage controlling method2025
Optical detection system and alignment method for a predetermined target object2024
Optical path correction subassembly, optical detection assembly, and optical det2024
Semiconductor inspecting method for ensuring scrubbing length on pad2023
Semiconductor inspecting method for ensuring scrubbing length on pad2023
Semiconductor inspecting method2023
Semiconductor inspecting method2023
Probe systems configured to test a device under test and methods of operating th2023
Probe station capable of maintaining position of probe tip upon temperature chan2022
Method of positioning probe tips relative to pads2021
Wafer probe station2021