KA

Ken Aihara

SC Shin-Etsu Handotai Co.: 12 patents #55 of 679Top 9%
Overall (All Time): #424,524 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
7713851 Method of manufacturing silicon epitaxial wafer Fumitaka Kume, Tomosuke Yoshida, Ryoji Hoshi, Satoshi Tobe, Naohisa Toda +1 more 2010-05-11
7189293 Method of producing annealed wafer and annealed wafer Norihiro Kobayashi, Masaro Tamatsuka, Takatoshi Nagoya, Wei Qu, Hiroshi Takeno 2007-03-13
7078357 Method for manufacturing silicon wafer and silicon wafer Satoshi Tobe 2006-07-18
6548035 Silicon single crystal wafer for epitaxial wafer, epitaxial wafer, and methods for producing the same and evaluating the same Akihiro Kimura, Makoto Iida, Yoshinori Hayamizu, Masanori Kimura 2003-04-15
6544656 Production method for silicon wafer and silicon wafer Takao Abe, Shoji Akiyama, Tetsuya Igarashi, Weifeng QU, Yoshinori Hayamizu +1 more 2003-04-08
6479312 Gallium phosphide luminescent device Masato Yamada, Susumu Higuchi, Kousei Yumoto, Makoto Kawasaki 2002-11-12
6478883 Silicon single crystal wafer, epitaxial silicon wafer, and methods for producing them Masaro Tamatsuka, Katsuhiko Miki, Hiroshi Takeno, Yoshinori Hayamizu 2002-11-12
6264906 Method for heat treatment of silicon substrate, substrate treated by the method, and epitaxial wafer utilizing the substrate Hiroshi Takeno 2001-07-24
6206961 Method of determining oxygen precipitation behavior in a silicon monocrystal Hiroshi Takeno 2001-03-27
6162708 Method for producing an epitaxial silicon single crystal wafer and the epitaxial silicon single crystal wafer Masaro Tamatsuka, Tomosuke Yoshida 2000-12-19
6143071 Method for heat treatment of silicon substrate, substrate treated by the method, and epitaxial wafer utilizing the substrate Hiroshi Takeno 2000-11-07
5533387 Method of evaluating silicon wafers Yutaka Kitagawara, Takao Takenaka 1996-07-09