Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7718446 | Evaluation method for crystal defect in silicon single crystal wafer | Hisayuki Saito | 2010-05-18 |
| 5841532 | Method for evaluating oxygen concentrating in semiconductor silicon single crystal | Tomosuke Yoshida | 1998-11-24 |
| 5612539 | Method of evaluating lifetime related quality of semiconductor surface | Ryoji Hoshi, Takao Takenaka | 1997-03-18 |
| 5533387 | Method of evaluating silicon wafers | Ken Aihara, Takao Takenaka | 1996-07-09 |
| 5444246 | Determining carbon concentration in silicon single crystal by FT-IR | Hiroshi Kubota, Masaro Tamatsuka | 1995-08-22 |
| 5386118 | Method and apparatus for determination of interstitial oxygen concentration in silicon single crystal | Hiroshi Kubota, Masaro Tamatsuka, Takao Takenaka, Kazuhisa Takamizawa | 1995-01-31 |
| 5302832 | Method for evaluation of spatial distribution of deep level concentration in semiconductor crystal | Ryoji Hoshi, Takao Takenaka | 1994-04-12 |
| 5228927 | Method for heat-treating gallium arsenide monocrystals | Susumu Kuwahara, Takao Takenaka | 1993-07-20 |
| 5209811 | Method for heat-treating gallium arsenide monocrystals | Susumu Kuwahara, Takao Takenaka | 1993-05-11 |