Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12154833 | Semiconductor doping characterization method using photoneutralization time constant of corona surface charge | Marshall D. Wilson, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk | 2024-11-26 |
| 12027430 | Semiconductor doping characterization method using photoneutralization time constant of corona surface charge | Marshall D. Wilson, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk | 2024-07-02 |
| 11561254 | Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates | Marshall D. Wilson, Bret Schrayer, Alexandre Savtchouk, Dmitriy Marinskiy | 2023-01-24 |
| 10969370 | Measuring semiconductor doping using constant surface potential corona charging | Marshall D. Wilson, Alexandre Savtchouk, Carlos Almeida, Csaba Buday | 2021-04-06 |
| 10763179 | Non-contact method to monitor and quantify effective work function of metals | Dmitriy Marinskiy, Thye Chong Loy, Sung-Li Wang, Lin-Jung Wu, Shyh-Shin Ferng +2 more | 2020-09-01 |
| 9685906 | Photoluminescence mapping of passivation defects for silicon photovoltaics | Marshall D. Wilson, Ferenc Korsos, Gyorgy Nadudvari | 2017-06-20 |
| 8912799 | Accurate measurement of excess carrier lifetime using carrier decay method | Marshall D. Wilson | 2014-12-16 |
| 8093920 | Accurate measuring of long steady state minority carrier diffusion lengths | Alexandre Savtchouk, Marshall D. Wilson | 2012-01-10 |
| 7202691 | Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers | Piotr Edelman, Dmitriy Marinskiy, Joseph Nicholas Kochey, Carlos Almeida | 2007-04-10 |
| 6815974 | Determining composition of mixed dielectrics | Marshall D. Wilson, John F. D'Amico, Alexandre Savtchouk, Lubomir L. Jastrzebski | 2004-11-09 |
| 6771091 | Method and system for elevated temperature measurement with probes designed for room temperature measurement | Piotr Edelman, Frank Gossett, Nick Kochey, Alexandre Savtchouk | 2004-08-03 |
| 6680621 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Alexander Savtchouk, John F. D'Amico, Marshall D. Wilson, Lubomir L. Jastrzebski | 2004-01-20 |
| 6597193 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Alexander Savtchouk, Marshall D. Wilson | 2003-07-22 |
| 6538462 | Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge | Marshall D. Wilson, Alexander Savtchouk | 2003-03-25 |
| 6512384 | Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages | Vladimir N. Faifer, Andrei Aleinikov | 2003-01-28 |
| 6114865 | Device for electrically contacting a floating semiconductor wafer having an insulating film | Alexander Savtchouk, Nick Kochev, Charles Schraver | 2000-09-05 |
| 6037797 | Measurement of the interface trap charge in an oxide semiconductor layer interface | Piotr Edelman, Marshall D. Wilson | 2000-03-14 |
| 5977788 | Elevated temperature measurement of the minority carrier lifetime in the depletion layer of a semiconductor wafer | — | 1999-11-02 |
| 5773989 | Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer | Piotr Edelman, Andrew M. Hoff, Lubek Jastrzebski | 1998-06-30 |
| 5663657 | Determining long minority carrier diffusion lengths | Lubek Jastrzebski, Andrzej Kontkiewicz, Piotr Edelman | 1997-09-02 |
| 5369495 | Semiconductor contaminant sensing system and method | — | 1994-11-29 |
| 5177351 | Method and apparatus for determining the minority carrier diffusion length from linear constant photon flux photovoltage measurements | — | 1993-01-05 |
| 5025145 | Method and apparatus for determining the minority carrier diffusion length from linear constant photon flux photovoltage measurements | — | 1991-06-18 |
| 4642565 | Method to determine the crystalline properties of an interface of two materials by photovoltage phenomenon | Lubomir L. Jastrzebski | 1987-02-10 |
| 4498772 | Method to determine the crystalline properties of an interface of two materials by an optical technique | Lubomir L. Jastrzebski | 1985-02-12 |