Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
DM

David Meltzer

SESeiko Epson: 22 patents #789 of 7,774Top 15%
IBM: 22 patents #4,909 of 70,183Top 7%
Wappingers Falls, NY: #41 of 884 inventorsTop 5%
New York: #2,285 of 115,490 inventorsTop 2%
Overall (All Time): #68,430 of 4,157,543Top 2%
44 Patents All Time

Issued Patents All Time

Showing 26–44 of 44 patents

Patent #TitleCo-InventorsDate
6990509 Ultra low power adder with sum synchronization Erdem Hokenek, Eko Lisuwandi, Mayan Moudgill, Victor Zyuban 2006-01-24
6665790 Vector register file with arbitrary vector addressing Clair John Glossner, III, Erdem Hokenek, Mayan Moudgill 2003-12-16
6604191 Method and apparatus for accelerating instruction fetching for a processor Brian King Flacks, Joel A. Silberman 2003-08-05
6580293 Body-contacted and double gate-contacted differential logic circuit and method of operation Kerry Bernstein, Peter E. Cottrell, Stephen V. Kosonocky, Edward J. Nowak, Kevin John Nowka +1 more 2003-06-17
6269039 System and method for refreshing memory devices Clair John Glossner, III, Erdem Hokenek, Mayan Moudgill 2001-07-31
6138208 Multiple level cache memory with overlapped L1 and L2 memory access Sang Hoo Dhong, Harm Peter Hofstee, Joel A. Silberman 2000-10-24
6065110 Method and apparatus for loading an instruction buffer of a processor capable of out-of-order instruction issue Joel A. Silberman 2000-05-16
6038659 Method for using read-only memory to generate controls for microprocessor Sang Hoo Dhong, Harm Peter Hofstee, Joel A. Silberman 2000-03-14
5987587 Single chip multiprocessor with shared execution units 1999-11-16
5953283 Multi-port SRAM with reduced access requirements Joel A. Silberman 1999-09-14
5875470 Multi-port multiple-simultaneous-access DRAM chip Jeffrey H. Dreibelbis, Wayne F. Ellis, Thomas J. Heller, Jr., Michael Ignatowski, Howard L. Kalter 1999-02-23
5544173 Delay test coverage without additional dummy latches in a scan-based test design 1996-08-06
5502731 Delay test coverage without additional dummy latches in a scan-based test design 1996-03-26
5365204 CMOS voltage controlled ring oscillator John M. Angiulli, Arun K. Ghose, Richard R. Konian, Samuel R. Levine, Wen-Yuan Wang +1 more 1994-11-15
4852095 Error detection circuit 1989-07-25
4823259 High speed buffer store arrangement for quick wide transfer of data Frederick J. Aichelmann, Jr., Rex H. Blumberg, James H. Pomerene, Thomas R. Puzak, Rudolph N. Rechtschaffen +1 more 1989-04-18
4466099 Information system using error syndrome for special control 1984-08-14
4453209 System for optimizing performance of paging store 1984-06-05
4368513 Partial roll mode transfer for cyclic bulk memory 1983-01-11