Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Muneki Hamashima — 42 Patents

NINikon: 27 patents #137 of 2,493Top 6%
EBEbara: 15 patents #135 of 1,611Top 9%
NKNippon Kogaku K.K.: 2 patents #156 of 382Top 45%
Fukaya, JP: #6 of 288 inventorsTop 3%
Overall (All Time): #72,062 of 4,157,543Top 2%
42 Patents All Time
Muneki Hamashima has been granted 42 US patents while listed as an inventor at Nikon. The first was granted in 1988 and the most recent in October 2019. Muneki Hamashima ranks #72,062 of 4,157,543 US inventors in our database (top 1.7%). Patent records list Muneki Hamashima in Fukaya, JP.

Issued Patents All Time

Showing 1–25 of 42 patents

Patent #TitleCo-InventorsDate
10429402 Washing/drying apparatus, screening apparatus, washing/drying method, and screening method Tadao ISAMI, Takehiko Ueda 2019-10-01
10412358 Image sensor, image-capturing apparatus and image-capturing system Kenichi Ishiga, Kiyoshige Shibazaki, Susumu Mori 2019-09-10
10027942 Imaging processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereon Kenichi Ishiga, Kiyoshige Shibazaki, Susumu Mori 2018-07-17
9906770 Image sensor, image-capturing apparatus and image capturing system Kenichi Ishiga, Kiyoshige Shibazaki, Susumu Mori 2018-02-27
9888226 Image capturing device and program to control image capturing device Kiyoshige Shibazaki, Susumu Mori 2018-02-06
9860516 Image processing apparatus, image processing method and recording medium Kiyoshige Shibazaki, Susumu Mori 2018-01-02
9854224 Image processing apparatus, image capturing apparatus, and image processing program Susumu Mori, Kiyoshige Shibazaki 2017-12-26
9838665 Image processing device, imaging device, and image processing program Kiyoshige Shibazaki, Susumu Mori, Kenichi Ishiga 2017-12-05
9727985 Image processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereon Kenichi Ishiga, Kiyoshige Shibazaki, Susumu Mori 2017-08-08
9706190 Image processing apparatus and image processing program Kiyoshige Shibazaki, Susumu Mori, Yumi Suzuki 2017-07-11
9706186 Imaging apparatus for generating parallax image data Kiyoshige Shibazaki, Susumu Mori, Fumiki Nakamura, Mamoru Iesaka, Junya Hagiwara +1 more 2017-07-11
9693036 Imaging apparatus, image processing device, computer-readable medium having stored thereon an imaging apparatus controlling program, and computer-readable medium having stored thereon an image processing program Kiyoshige Shibazaki 2017-06-27
9532033 Image sensor and imaging device Kiyoshige Shibazaki, Susumu Mori, Satoshi Suzuki 2016-12-27
9414046 Image sensor, imaging device and image processing device Kiyoshige Shibazaki, Susumu Mori 2016-08-09
9341935 Image capturing device 2016-05-17
7888642 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Mamoru Nakasuji, Nabuharu Noji, Tohru Satake, Masahiro Hatakeyama, Kenji Watanabe +7 more 2011-02-15
RE41665 Object observation apparatus and object observation Yoichi Watanabe, Yoshiaki Kohama 2010-09-14
7745784 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Mamoru Nakasuji, Tohru Satake, Kenji Watanabe, Takeshi Murakami, Nobuharu Noji +9 more 2010-06-29
7601972 Inspection system by charged particle beam and method of manufacturing devices using the system Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Toshifumi Kimba, Hirosi Sobukawa +5 more 2009-10-13
7598471 Method of electric discharge machining a cathode for an electron gun Takao Kato, Mamoru Nakasuji, Nobuharu Noji, Tohru Satake 2009-10-06
7439502 Electron beam apparatus and device production method using the electron beam apparatus Mamoru Nakasuji, Tohru Satake, Nobuharu Noji, Hirosi Sobukawa, Tsutomu Karimata +6 more 2008-10-21
7423267 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Masahiro Hatakeyama, Kenji Watanabe +7 more 2008-09-09
RE40221 Object observation apparatus and object observation Yoichi Watanabe, Yoshiaki Kohama 2008-04-08
7297949 Inspection system by charged particle beam and method of manufacturing devices using the system Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Toshifumi Kimba, Hirosi Sobukawa +5 more 2007-11-20
7247848 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Mamoru Nakasuji, Tohru Satake, Kenji Watanabe, Takeshi Murakami, Nobuharu Noji +9 more 2007-07-24