DW

David Watts

Motorola: 7 patents #1,488 of 12,470Top 15%
IBM: 5 patents #18,733 of 70,183Top 30%
T( The Nielsen Company (Us): 3 patents #349 of 768Top 50%
RM Royse Manufacturing: 1 patents #2 of 6Top 35%
Overall (All Time): #232,077 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12101530 Methods and apparatus to identify user presence to a meter 2024-09-24
11895363 Methods and apparatus to identify user presence to a meter 2024-02-06
11363334 Methods and apparatus to identify user presence to a meter 2022-06-14
9219819 Load balancing and sharing of contextual information in a multi-vendor and/or multiple contact center environment Kevin Glass 2015-12-22
8137158 Electrical contact method Rui Fang, Deepak Kulkarni 2012-03-20
7883395 Electrical contact structures and methods for use Rui Fang, Deepak Kulkarni 2011-02-08
7820051 Recycling of electrochemical-mechanical planarization (ECMP) slurries/electrolytes Rui Fang, Deepak Kulkarni 2010-10-26
7807036 Method and system for pad conditioning in an ECMP process Rui Fang, Deepak Kulkarni 2010-10-05
7544609 Method for integrating liner formation in back end of line processing Matthew S. Angyal, Habib Hichri, Christopher J. Penny 2009-06-09
6379463 Web coating material supply apparatus and method John Kelley 2002-04-30
6372111 Method and apparatus for reclaiming a metal from a CMP process for use in an electroplating process 2002-04-16
6362103 Method and apparatus for rejuvenating a CMP chemical solution 2002-03-26
6096652 Method of chemical mechanical planarization using copper coordinating ligands János Farkas, Jason Aquinde GOMEZ, Chelsea Dang 2000-08-01
6071816 Method of chemical mechanical planarization using a water rinse to prevent particle contamination Rajeev Bajaj, Sanjit Das 2000-06-06
6045435 Low selectivity chemical mechanical polishing (CMP) process for use on integrated circuit metal interconnects Rajeev Bajaj, Subramoney Iyer, Thom Kobayashi, Jaime Saravia, Mark G. Fernandes 2000-04-04
6001730 Chemical mechanical polishing (CMP) slurry for polishing copper interconnects which use tantalum-based barrier layers János Farkas, Rajeev Bajaj, Melissa Freeman, Sanjit Das 1999-12-14
5985748 Method of making a semiconductor device using chemical-mechanical polishing having a combination-step process Franklin D. Nkansah, John Mendonca 1999-11-16
5935871 Process for forming a semiconductor device János Farkas, Melissa Freeman 1999-08-10
5897375 Chemical mechanical polishing (CMP) slurry for copper and method of use in integrated circuit manufacture Rajeev Bajaj, Sanjit Das, János Farkas, Chelsea Dang, Melissa Freeman +3 more 1999-04-27