Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11800029 | Transport device, document reading device, and image forming apparatus | Miho Morita, Tomonori Sato, Tsuyoshi Mabara, Isamu Adachi, Tomomi Ishida | 2023-10-24 |
| 11782380 | Document reading device and image forming apparatus | Tomonori Sato, Miho Morita, Tsuyoshi Mabara, Isamu Adachi, Tomomi Ishida | 2023-10-10 |
| 10868921 | Information processing device, imaging device, and system | Tatsuya Aizawa | 2020-12-15 |
| 8814156 | Sheet processing apparatus and image forming system | — | 2014-08-26 |
| 8242605 | Semiconductor device and method of manufacturing the same | Hiroyuki ARIE, Nobuaki UMEMURA, Nobuto Nakanishi, Kimio HARA, Kyoya Nitta +1 more | 2012-08-14 |
| 7674668 | Method of manufacturing a semiconductor device | Norio Ishitsuka, Tomio Iwasaki | 2010-03-09 |
| 6914307 | Semiconductor device and method of manufacturing the same | Toshiaki Iwamatsu, Takashi Ipposhi, Hideki Naruoka, Shigeto Maegawa, Yasuo Yamaguchi +1 more | 2005-07-05 |
| 6844242 | Method of manufacturing SOI wafer | Hideki Naruoka, Hidekazu Yamamoto | 2005-01-18 |
| 6769111 | Computer-implemented method of process analysis | Toshiaki Mugibayashi | 2004-07-27 |
| 6741940 | Computer-implemented method of defect analysis | Toshiaki Mugibayashi | 2004-05-25 |
| 6646306 | Semiconductor device | Toshiaki Iwamatsu, Takashi Ipposhi, Hideki Naruoka, Shigeto Maegawa, Yasuo Yamaguchi +1 more | 2003-11-11 |
| 6473665 | Defect analysis method and process control method | Toshiaki Mugibayashi | 2002-10-29 |
| 6465316 | SOI substrate and semiconductor device | Satoshi Yamakawa, Junji Nakanishi | 2002-10-15 |
| 6372593 | Method of manufacturing SOI substrate and semiconductor device | Satoshi Yamakawa, Junji Nakanishi | 2002-04-16 |
| 6341241 | Defect analysis method and process control method | Toshiaki Mugibayashi | 2002-01-22 |
| 6252294 | Semiconductor device and semiconductor storage device | Hideki Naruoka, Hidekazu Yamamoto | 2001-06-26 |
| 6202037 | Quality management system and recording medium | Kaoru Yamana, Tomoki Tamada | 2001-03-13 |
| 6016562 | Inspection data analyzing apparatus for in-line inspection with enhanced display of inspection results | Yoko Miyazaki, Junko Izumitani, Masahiko Ikeno | 2000-01-18 |
| 5517027 | Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these | Yoshitsugu Nakagawa, Fusami Soeda, Naohiko Fujino, Isamu Karino, Osamu Wada +6 more | 1996-05-14 |
| 5129198 | Cleaning device for semiconductor wafers | Itaru Kanno, Takaaki Fukumoto, Masuo Tada | 1992-07-14 |
| 5048331 | Continuous rainwater monitoring system | Takaaki Fukumoto | 1991-09-17 |
| 4893320 | Apparatus for counting particles attached to surfaces of a solid | Motonori Yanagi, Masaharu Hama, Takaaki Fukumoto | 1990-01-09 |