Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6551847 | Inspection analyzing apparatus and semiconductor device | Kyoko Asahina, Yoko Miyazaki | 2003-04-22 |
| 6202037 | Quality management system and recording medium | Nobuyoshi Hattori, Tomoki Tamada | 2001-03-13 |