TI

Takashi Ipposhi

Mitsubishi Electric: 55 patents #104 of 25,717Top 1%
RT Renesas Technology: 53 patents #4 of 3,337Top 1%
RE Renesas Electronics: 4 patents #1,016 of 4,529Top 25%
RE Ryoden Semiconductor System Engineering: 2 patents #57 of 195Top 30%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
📍 Kasai, JP: #14 of 5,842 inventorsTop 1%
Overall (All Time): #11,324 of 4,157,543Top 1%
113
Patents All Time

Issued Patents All Time

Showing 1–25 of 113 patents

Patent #TitleCo-InventorsDate
10923422 Semiconductor device Katsumi Eikyu, Fumihito Ota 2021-02-16
10861786 Semiconductor device having a multilayer structure Yoshikazu Nagamura, Katsumi Eikyu 2020-12-08
8067804 Semiconductor device having an SOI structure, manufacturing method thereof, and memory circuit Shigeto Maegawa 2011-11-29
7898032 Semiconductor device and a method of manufacturing the same Takaya Suzuki 2011-03-01
7786534 Semiconductor device having SOI structure Yukio Maki, Toshiaki Iwamatsu 2010-08-31
7741679 Semiconductor device, method of manufacturing same and method of designing same Yasuo Yamaguchi, Shigeto Maegawa, Toshiaki Iwamatsu, Shigenobu Maeda, Yuuichi Hirano +2 more 2010-06-22
7675122 Semiconductor memory device Yuuichi Hirano, Shigeto Maegawa, Koji Nii 2010-03-09
7649238 Semiconductor device Tetsuya Watanabe 2010-01-19
7608879 Semiconductor device including a capacitance Shigenobu Maeda, Yuuichi Hirano 2009-10-27
7598570 Semiconductor device, SRAM and manufacturing method of semiconductor device Yuuichi Hirano 2009-10-06
7556997 Method of manufacturing semiconductor device having impurity region under isolation region Shigenobu Maeda, Toshiaki Iwamatsu 2009-07-07
7553741 Manufacturing method of semiconductor device 2009-06-30
7541644 Semiconductor device with effective heat-radiation Yuuichi Hirano, Shigenobu Maeda, Takuji Matsumoto, Shigeto Maegawa 2009-06-02
7535062 Semiconductor device having SOI structure Yukio Maki, Toshiaki Iwamatsu 2009-05-19
7504291 MOS transistor on an SOI substrate with a body contact and a gate insulating film with variable thickness Shigenobu Maeda, Takuji Matsumoto, Toshiaki Iwamatsu 2009-03-17
7494883 Semiconductor device having a trench isolation and method of fabricating the same Toshiaki Iwamatsu, Takuji Matsumoto, Shigenobu Maeda 2009-02-24
7470582 Method of manufacturing semiconductor device having impurity region under isolation region Shigenobu Maeda, Toshiaki Iwamatsu 2008-12-30
7453135 Semiconductor device and method of manufacturing the same Toshiaki Iwamatsu 2008-11-18
7449749 Semiconductor device for limiting leakage current Toshiaki Iwamatsu 2008-11-11
7402865 Semiconductor device including a contact connected to the body and method of manufacturing the same Toshiaki Iwamatsu, Shigeto Maegawa 2008-07-22
7391095 Semiconductor device Tetsuya Watanabe 2008-06-24
7382026 Semiconductor memory device and method of manufacturing the same Yuuichi Hirano, Shigeto Maegawa, Koji Nii 2008-06-03
7358555 Semiconductor device Toshiaki Iwamatsu, Tatsuhiko Ikeda, Shigeto Maegawa 2008-04-15
7352049 Semiconductor device and method of manufacturing the same Toshiaki Iwamatsu 2008-04-01
7339238 Semiconductor device including a capacitance Shigenobu Maeda, Yuuichi Hirano 2008-03-04