KK

Kyle K. Kirby

Micron: 200 patents #39 of 6,345Top 1%
AI Aptina Imaging: 4 patents #62 of 332Top 20%
RR Round Rock Research: 2 patents #110 of 239Top 50%
📍 Eagle, ID: #2 of 278 inventorsTop 1%
🗺 Idaho: #25 of 8,810 inventorsTop 1%
Overall (All Time): #2,990 of 4,157,543Top 1%
210
Patents All Time

Issued Patents All Time

Showing 176–200 of 210 patents

Patent #TitleCo-InventorsDate
7265330 Microelectronic imagers with optical devices and methods of manufacturing such microelectronic imagers Warren M. Farnworth, Sidney B. Rigg, William M. Hiatt, Alan G. Wood, Peter Benson +4 more 2007-09-04
7262134 Microfeature workpieces and methods for forming interconnects in microfeature workpieces William M. Hiatt, Richard L. Stocks 2007-08-28
7253397 Packaged microelectronic imagers and methods of packaging microelectronic imagers 2007-08-07
7244663 Wafer reinforcement structure and methods of fabrication 2007-07-17
7232754 Microelectronic devices and methods for forming interconnects in microelectronic devices Salman Akram, David R. Hembree, Sidney B. Rigg, Warren M. Farnworth, William M. Hiatt 2007-06-19
7224051 Semiconductor component having plate and stacked dice Warren M. Farnworth, Alan G. Wood, William M. Hiatt, James M. Wark, David R. Hembree +1 more 2007-05-29
7199439 Microelectronic imagers and methods of packaging microelectronic imagers Warren M. Farnworth, Sidney B. Rigg, William M. Hiatt, Peter Benson, James M. Wark +4 more 2007-04-03
7189954 Microelectronic imagers with optical devices and methods of manufacturing such microelectronic imagers Warren M. Farnworth, Sidney B. Rigg, William M. Hiatt, Alan G. Wood, Peter Benson +4 more 2007-03-13
7189642 Methods of fabricating interconnects including depositing a first material in the interconnect with a thickness of angstroms and a low temperature for semiconductor components Shuang Meng, Garo Derderian 2007-03-13
7169248 Methods for releasably attaching support members to microfeature workpieces and microfeature assemblies formed using such methods Steven Oliver 2007-01-30
7148715 Systems and methods for testing microelectronic imagers and microfeature devices Salman Akram, William M. Hiatt, Alan G. Wood, Charles M. Watkins 2006-12-12
7129567 Substrate, semiconductor die, multichip module, and system including a via structure comprising a plurality of conductive elements Warren M. Farnworth 2006-10-31
7109068 Through-substrate interconnect fabrication methods Salman Akram 2006-09-19
7101792 Methods of plating via interconnects Warren M. Farnworth 2006-09-05
7091124 Methods for forming vias in microelectronic devices, and methods for packaging microelectronic devices Sidney B. Rigg, Charles M. Watkins, Peter Benson, Salman Akram 2006-08-15
7078922 Semiconductor interconnect having semiconductor spring contacts 2006-07-18
7071098 Methods of fabricating interconnects for semiconductor components including a through hole entirely through the component and forming a metal nitride including separate precursor cycles Shuang Meng, Garo Derderian 2006-07-04
7064010 Methods of coating and singulating wafers Warren M. Farnworth, William M. Hiatt 2006-06-20
7060526 Wafer level methods for fabricating multi-dice chip scale semiconductor components Warren M. Farnworth, Alan G. Wood, William M. Hiatt, James M. Wark, David R. Hembree +1 more 2006-06-13
7053641 Interconnect having spring contacts 2006-05-30
7042080 Semiconductor interconnect having compliant conductive contacts Warren M. Farnworth 2006-05-09
7030632 Compliant contract structures, contactor cards and test system including same Charles M. Watkins 2006-04-18
6998345 Methods of forming via plugs using an aerosol stream of particles to deposit conductive material 2006-02-14
6998717 Multi-dice chip scale semiconductor components Warren M. Farnworth, Alan G. Wood, William M. Hiatt, James M. Wark, David R. Hembree +1 more 2006-02-14
6982565 Test system and test method with interconnect having semiconductor spring contacts 2006-01-03