DH

David R. Hembree

Micron: 360 patents #9 of 6,345Top 1%
AI Aptina Imaging: 4 patents #62 of 332Top 20%
📍 Boise, ID: #4 of 3,546 inventorsTop 1%
🗺 Idaho: #5 of 8,810 inventorsTop 1%
Overall (All Time): #792 of 4,157,543Top 1%
366
Patents All Time

Issued Patents All Time

Showing 276–300 of 366 patents

Patent #TitleCo-InventorsDate
6218848 Semiconductor probe card having resistance measuring circuitry and method of fabrication Salman Akram 2001-04-17
6215181 Method and apparatus providing redundancy for fabricating highly reliable memory modules Salman Akram, James M. Wark 2001-04-10
6215322 Conventionally sized temporary package for testing semiconductor dice Warren M. Farnworth, Alan G. Wood, Salman Akram 2001-04-10
6210984 Method and apparatus for automatically positioning electronic dice within component packages Warren M. Farnworth, Alan G. Wood, John O. Jacobson, James M. Wark, Jennifer L. Folaron +3 more 2001-04-03
6211960 Method and apparatus for aligning and connecting semiconductor components to substrates 2001-04-03
6207548 Method for fabricating a micromachined chip scale package Salman Akram, Warren M. Farnworth 2001-03-27
6208157 Method for testing semiconductor components Salman Akram, Warren M. Farnworth, Derek Gochnour, Alan G. Wood, John O. Jacobson 2001-03-27
6208156 Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems 2001-03-27
6196096 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, Michael E. Hess 2001-03-06
6189772 Method of forming a solder ball 2001-02-20
6181144 Semiconductor probe card having resistance measuring circuitry and method fabrication Salman Akram 2001-01-30
6175242 Method for forming coaxial silicon interconnects Salman Akram, Alan G. Wood 2001-01-16
6175241 Test carrier with decoupling capacitors for testing semiconductor components Salman Akram 2001-01-16
6155247 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, Michael E. Hess 2000-12-05
6150828 Method and apparatus for automatically positioning electronic dice with component packages Warren M. Farnworth, Alan G. Wood, John O. Jacobson, James M. Wark, Jennifer L. Folaron +3 more 2000-11-21
6132570 Method and apparatus for continuous processing of semiconductor wafers Salman Akram 2000-10-17
6124634 Micromachined chip scale package Salman Akram, Warren M. Farnworth 2000-09-26
6124214 Method and apparatus for ultrasonic wet etching of silicon Salman Akram 2000-09-26
6121576 Method and process of contact to a heat softened solder ball array Warren M. Farnworth 2000-09-19
6119675 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, Michael E. Hess 2000-09-19
6117797 Attachment method for heat sinks and devices involving removal of misplaced encapsulant 2000-09-12
6100175 Method and apparatus for aligning and attaching balls to a substrate Alan G. Wood, Salman Akram, Mike Hess 2000-08-08
6094058 Temporary semiconductor package having dense array external contacts Warren M. Farnworth, Alan G. Wood, Salman Akram 2000-07-25
6091252 Method, apparatus and system for testing bumped semiconductor components Salman Akram, Warren M. Farnworth, Alan G. Wood 2000-07-18
6087676 Multi-chip module system Salman Akram, James M. Wark 2000-07-11