PK

Pieter Kruit

MB Mapper Lithography Ip B.V.: 47 patents #2 of 84Top 3%
TD Technische Universiteit Delft: 13 patents #1 of 311Top 1%
U.S. Philips: 8 patents #426 of 8,851Top 5%
Applied Materials: 6 patents #1,918 of 7,310Top 30%
FE Fei: 3 patents #184 of 681Top 30%
AB Asml Netherlands B.V.: 3 patents #1,156 of 3,192Top 40%
EL Elith: 2 patents #1 of 14Top 8%
DB Delmic Ip B.V.: 2 patents #4 of 6Top 70%
HH Hitachi High-Technologies: 2 patents #456 of 1,200Top 40%
AG Agere Systems Guardian: 1 patents #274 of 810Top 35%
AS Agere Systems: 1 patents #984 of 1,849Top 55%
AT AT&T: 1 patents #10,626 of 18,772Top 60%
📍 Delft, NL: #1 of 1,192 inventorsTop 1%
Overall (All Time): #17,412 of 4,157,543Top 1%
91
Patents All Time

Issued Patents All Time

Showing 76–91 of 91 patents

Patent #TitleCo-InventorsDate
6919952 Direct write lithography system 2005-07-19
6897458 Electron beam exposure system Marco Jan-Jaco Wieland, Bert Jan Kampherbeek, Alexander Hendrik Vincent Van Veen 2005-05-24
6844560 Lithography system comprising a converter plate and means for protecting the converter plate Marco Jan-Jaco Wieland, Bert Jan Kampherbeek 2005-01-18
6670611 Electron microscope Hindrik Willem Mook 2003-12-30
6633366 Lithographic apparatus, device manufacturing method, and device manufactured thereby Pieter Willem Herman De Jager, Arno Jan Bleeker, Karel Diederick Van Der Mast 2003-10-14
6335783 Lithography system 2002-01-01
6333508 Illumination system for electron beam lithography tool Victor Katsap, Daniel Moonen, Warren K. Waskiewicz 2001-12-25
5838004 Particle-optical apparatus comprising a fixed diaphragm for the monochromator filter Peter Christiaan Tiemeijer, J. Chmelik 1998-11-17
5587586 Particle-optical apparatus comprising an electron source with a needle and a membrane-like extraction electrode 1996-12-24
5578822 Particle-optical apparatus comprising a detector for secondary electrons Karel Diederick Van Der Mast, Kars Z. Troost, Alexander Henstra 1996-11-26
5466937 Additive composition of defocusing images in an electron microscope 1995-11-14
5268579 Monopole magnetic lens field Arno Jan Bleeker 1993-12-07
5003172 Auger spectrometry Arno Jan Bleeker, John A. Venables 1991-03-26
4977324 Charged particle beam apparatus Karel Diederick Van Der Mast 1990-12-11
4882486 Electron detection with energy discrimination 1989-11-21
4500787 Method and a device for furnishing an ion stream Jan B. Le Poole 1985-02-19