Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12202019 | Method and system for the removal and/or avoidance of contamination in charged particle beam systems | Marc Smits, Johan Joost Koning, Chris Franciscus Jessica Lodewijk, Ludovic Lattard | 2025-01-21 |
| 11738376 | Method and system for the removal and/or avoidance of contamination in charged particle beam systems | Marc Smits, Johan Joost Koning, Chris Franciscus Jessica Lodewijk, Ludovic Lattard | 2023-08-29 |
| 10987705 | Method and system for the removal and/or avoidance of contamination in charged particle beam systems | Marc Smits, Johan Joost Koning, Chris Franciscus Jessica Lodewijk, Ludovic Lattard | 2021-04-27 |
| 10632509 | Method and system for the removal and/or avoidance of contamination in charged particle beam systems | Marc Smits, Johan Joost Koning, Chris Franciscus Jessica Lodewijk, Ludovic Lattard | 2020-04-28 |
| 9981293 | Method and system for the removal and/or avoidance of contamination in charged particle beam systems | Marc Smits, Johan Joost Koning, Chris Franciscus Jessica Lodewijk, Ludovic Lattard | 2018-05-29 |
| 6670611 | Electron microscope | Pieter Kruit | 2003-12-30 |
| 6452169 | Wien filter | — | 2002-09-17 |