| 11056322 |
Method and apparatus for determining process rate |
Yassine Kabouzi, Andrew D. Bailey, III, Jorge Luque, Seonkyung Lee, Thorsten Lill |
2021-07-06 |
| 10930478 |
Apparatus with optical cavity for determining process rate |
Jagadeeshwari MANNE, Yassine Kabouzi |
2021-02-23 |
| 10903050 |
Endpoint sensor based control including adjustment of an edge ring parameter for each substrate processed to maintain etch rate uniformity |
Yassine Kabouzi |
2021-01-26 |
| 10784174 |
Method and apparatus for determining etch process parameters |
Yassine Kabouzi |
2020-09-22 |
| 10504704 |
Plasma etching systems and methods using empirical mode decomposition |
Yassine Kabouzi, Jorge Luque, Andrew D. Bailey, III |
2019-12-10 |
| 10302553 |
Gas exhaust by-product measurement system |
Cristian Siladie, Yassine Kabouzi, Edward J. McInerney, Sassan Roham |
2019-05-28 |
| 10249476 |
Control of impedance of RF return path |
Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi |
2019-04-02 |
| 10157730 |
Control of impedance of RF delivery path |
Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi |
2018-12-18 |
| 10134569 |
Method and apparatus for real-time monitoring of plasma chamber wall condition |
Yassine Kabouzi, Jorge Luque |
2018-11-20 |
| 9735069 |
Method and apparatus for determining process rate |
Yassine Kabouzi, Andrew D. Bailey, III, Jorge Luque, Seonkyung Lee, Thorsten Lill |
2017-08-15 |
| 9548189 |
Plasma etching systems and methods using empirical mode decomposition |
Yassine Kabouzi, Jorge Luque, Andrew D. Bailey, III |
2017-01-17 |
| 9401264 |
Control of impedance of RF delivery path |
Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi |
2016-07-26 |
| 9337000 |
Control of impedance of RF return path |
Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi |
2016-05-10 |
| 9119283 |
Chamber matching for power control mode |
— |
2015-08-25 |
| 9107284 |
Chamber matching using voltage control mode |
— |
2015-08-11 |
| 8894804 |
Plasma unconfinement sensor and methods thereof |
Jean-Paul Booth, Alexei Marakhtanov, Rajinder Dhindsa, Seyed Jafar Jafarian-Tehrani |
2014-11-25 |
| 8618807 |
Arrangement for identifying uncontrolled events at the process module level and methods thereof |
Vijayakumar C. Venugopal |
2013-12-31 |
| 8473089 |
Methods and apparatus for predictive preventive maintenance of processing chambers |
Eric A. Pape, Vijayakumar C. Venugopal, Brian Choi |
2013-06-25 |
| 8164353 |
RF-biased capacitively-coupled electrostatic (RFB-CCE) probe arrangement for characterizing a film in a plasma processing chamber |
Jean-Paul Booth, Jung-Hea Kim, Douglas Keil |
2012-04-24 |