LA

Luc Albarede

Lam Research: 19 patents #137 of 2,128Top 7%
Overall (All Time): #236,288 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11056322 Method and apparatus for determining process rate Yassine Kabouzi, Andrew D. Bailey, III, Jorge Luque, Seonkyung Lee, Thorsten Lill 2021-07-06
10930478 Apparatus with optical cavity for determining process rate Jagadeeshwari MANNE, Yassine Kabouzi 2021-02-23
10903050 Endpoint sensor based control including adjustment of an edge ring parameter for each substrate processed to maintain etch rate uniformity Yassine Kabouzi 2021-01-26
10784174 Method and apparatus for determining etch process parameters Yassine Kabouzi 2020-09-22
10504704 Plasma etching systems and methods using empirical mode decomposition Yassine Kabouzi, Jorge Luque, Andrew D. Bailey, III 2019-12-10
10302553 Gas exhaust by-product measurement system Cristian Siladie, Yassine Kabouzi, Edward J. McInerney, Sassan Roham 2019-05-28
10249476 Control of impedance of RF return path Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi 2019-04-02
10157730 Control of impedance of RF delivery path Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi 2018-12-18
10134569 Method and apparatus for real-time monitoring of plasma chamber wall condition Yassine Kabouzi, Jorge Luque 2018-11-20
9735069 Method and apparatus for determining process rate Yassine Kabouzi, Andrew D. Bailey, III, Jorge Luque, Seonkyung Lee, Thorsten Lill 2017-08-15
9548189 Plasma etching systems and methods using empirical mode decomposition Yassine Kabouzi, Jorge Luque, Andrew D. Bailey, III 2017-01-17
9401264 Control of impedance of RF delivery path Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi 2016-07-26
9337000 Control of impedance of RF return path Alexei Marakhtanov, Rajinder Dhindsa, Ken Lucchesi 2016-05-10
9119283 Chamber matching for power control mode 2015-08-25
9107284 Chamber matching using voltage control mode 2015-08-11
8894804 Plasma unconfinement sensor and methods thereof Jean-Paul Booth, Alexei Marakhtanov, Rajinder Dhindsa, Seyed Jafar Jafarian-Tehrani 2014-11-25
8618807 Arrangement for identifying uncontrolled events at the process module level and methods thereof Vijayakumar C. Venugopal 2013-12-31
8473089 Methods and apparatus for predictive preventive maintenance of processing chambers Eric A. Pape, Vijayakumar C. Venugopal, Brian Choi 2013-06-25
8164353 RF-biased capacitively-coupled electrostatic (RFB-CCE) probe arrangement for characterizing a film in a plasma processing chamber Jean-Paul Booth, Jung-Hea Kim, Douglas Keil 2012-04-24