Issued Patents All Time
Showing 26–44 of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7755042 | Auger electron spectrometer with applied magnetic field at target surface | Gabor Toth, Rudy F. Garcia, Chris Huang, Niles K. MacDonald, Garrett Pickard +3 more | 2010-07-13 |
| 7635842 | Method and instrument for chemical defect characterization in high vacuum | Ming Lun Yu, Stuart L. Friedman, Gabor Toth | 2009-12-22 |
| 7612348 | Transverse magnetic field voltage isolator | Alexander Jozef Gubbens, Niles K. MacDonald, Rudy F. Garcia, Doug K. Masnaghetti | 2009-11-03 |
| 7598492 | Charged particle microscopy using super resolution | Kenneth Krzeczowski, Mathew H. Lent | 2009-10-06 |
| 7576317 | Calibration standard for a dual beam (FIB/SEM) machine | Marco Tortonese | 2009-08-18 |
| 7440086 | Methods and systems for creating a recipe for a defect review process | S. Mark Borowicz, Kenneth J. Krzeckzowski | 2008-10-21 |
| 7394339 | Transverse magnetic field voltage isolator | Alexander Jozef Gubbens, Niles K. MacDonald, Rudy F. Garcia, Doug K. Masnaghetti | 2008-07-01 |
| 7372016 | Calibration standard for a dual beam (FIB/SEM) machine | Marco Tortonese | 2008-05-13 |
| 7365321 | Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis | Mark Borowicz | 2008-04-29 |
| 7148073 | Methods and systems for preparing a copper containing substrate for analysis | David Aitan Soltz, Harold F. Winters, John W. Coburn, Alexander Jozef Gubbens, Gabor Toth | 2006-12-12 |
| 7078689 | Integrated electron beam and contaminant removal system | David L. Adler | 2006-07-18 |
| 6943350 | Methods and apparatus for electron beam inspection of samples | Michael Cull | 2005-09-13 |
| 6810105 | Methods and apparatus for dishing and erosion characterization | Phil Wood | 2004-10-26 |
| 6801596 | Methods and apparatus for void characterization | Anne Testoni, Steve Oestreich | 2004-10-05 |
| 6677586 | Methods and apparatus for electron beam inspection of samples | Michael Cull | 2004-01-13 |
| 6664541 | Methods and apparatus for defect localization | Jeffrey Reichert | 2003-12-16 |
| 6271529 | Ion implantation with charge neutralization | Marvin Farley, Vadim G. Dudnikov | 2001-08-07 |
| 6184532 | Ion source | Vadim G. Dudnikov | 2001-02-06 |
| 5907158 | Broad range ion implanter | Andrew B. Wittkower, Hilton F. Glavish, Kenneth H. Purser, Gaylord C. Noblitt, III | 1999-05-25 |