Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Kris Bhaskar, Laurent Karsenti, Scott A. Young, Mohan Mahadevan, Jing Zhang +4 more | 2023-02-14 |
| 11508109 | Methods and apparatus for machine learning rendering | Alexei V. Bourd, Reza Pourreza Shahri, Dam Backer, Brian Ellis, Roman Larionov +2 more | 2022-11-22 |
| 11170255 | Training a machine learning model with synthetic images | Ian James Riley, Sankar Venkataraman, Michael Kowalski, Arjun Hegde | 2021-11-09 |
| 10789703 | Semi-supervised anomaly detection in scanning electron microscope images | Shaoyu Lu, Sankar Venkataraman | 2020-09-29 |
| 10607119 | Unified neural network for defect detection and classification | Mohan Mahadevan, Sankar Venkataraman, Huajun Ying, Hedong Yang | 2020-03-31 |
| 10482590 | Method and system for defect classification | Chien-Huei Chen, Sankar Venkataraman, John R. Jordan, Huajun Ying, Sinha Harsh | 2019-11-19 |
| 10436720 | Adaptive automatic defect classification | Martin Plihal, Huajun Ying, Anadi Bhatia, Amitoz Singh Dandiana, Ramakanth Ramini | 2019-10-08 |
| 9922269 | Method and system for iterative defect classification | Sankar Venkataraman, John R. Jordan, Oksen Baris, Harsh Sinha | 2018-03-20 |
| 9898811 | Method and system for defect classification | Chien-Huei Chen, Sankar Venkataraman, John R. Jordan, Huajun Ying, Harsh Sinha | 2018-02-20 |
| 6943358 | Method for developing a calibration algorithm for quantifying the hydrocarbon content of aqueous media | John M. Andrews, Stephen H. Lieberman | 2005-09-13 |