ZC

Zhongwei Chen

HM Hermes Microvision: 51 patents #1 of 68Top 2%
AB Asml Netherlands B.V.: 32 patents #110 of 3,192Top 4%
BP Borries Pte.: 10 patents #1 of 5Top 20%
FC Focus-Ebeam Technology (Beijing) Co.: 3 patents #3 of 5Top 60%
University of California: 2 patents #4,561 of 18,278Top 25%
UN Unknown: 2 patents #12,644 of 83,584Top 20%
Overall (All Time): #11,360 of 4,157,543Top 1%
112
Patents All Time

Issued Patents All Time

Showing 25 most recent of 112 patents

Patent #TitleCo-InventorsDate
12424408 Apparatus of plural charged-particle beams Shuai Li, Weiming Ren, Xuedong Liu, Juying Dou, Xuerang Hu 2025-09-23
12341185 Aqueous zinc lithium-ion battery and method for making same Ali Ghorbani Kashkooli, Sepehr Khazraei 2025-06-24
12341150 Quasi-solid-state electrolyte composite based on three-dimensionally ordered macroporous metal-organic framework materials for lithium secondary battery and method for manufacturing the same 2025-06-24
12300458 Objective lens system for fast scanning large FOV Shuai Li 2025-05-13
12249114 Stripe image processing method and apparatus for camera optical communication Wenping Liu, Qian Deng, Guoqiang Fu, Sihan Li, Zeliang Huang +1 more 2025-03-11
12237143 Apparatus of plural charged-particle beams Weiming Ren, Xuedong Liu, Xuerang Hu 2025-02-25
12191109 Sample pre-charging methods and apparatuses for charged particle beam inspection Xuedong Liu, Qingpo Xi, Youfei Jiang, Weiming Ren, Xuerang Hu 2025-01-07
12087541 Apparatus of plural charged-particle beams Weiming Ren, Shuai Li, Xuedong Liu 2024-09-10
11935720 Field-emission type electron source and charged particle beam device using the same Dazhi Chen 2024-03-19
11929232 Systems and methods for charged particle flooding to enhance voltage contrast defect signal Frank Zhang, Yixiang Wang, Ying Shen 2024-03-12
11887807 Apparatus of plural charged-particle beams Weiming Ren, Xuedong Liu, Xuerang Hu 2024-01-30
11854763 Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof Wei FANG, Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-12-26
11854762 MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same Wei FANG, Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-12-26
11848169 Field-emission type electron source and charged particle beam device using the same Dazhi Chen 2023-12-19
11837431 Objective lens system for fast scanning large FOV Shuai Li 2023-12-05
11798777 Charged particle beam apparatus, and systems and methods for operating the apparatus Martinus Gerardus Johannes Maria MAASSEN, Peter Paul HEMPENIUS, Weiming Ren 2023-10-24
11784024 Multi-cell detector for charged particles Joe Wang, Yongxin Wang, Xuerang Hu 2023-10-10
11715619 Method and apparatus for charged particle detection Yongxin Wang, Weiming Ren, Zhonghua Dong 2023-08-01
11705304 Apparatus of plural charged-particle beams Shuai Li, Weiming Ren, Xuedong Liu, Juying Dou, Xuerang Hu 2023-07-18
11688580 Apparatus of plural charged-particle beams Xuedong Liu, Weiming Ren, Shuai Li 2023-06-27
11676792 Sample pre-charging methods and apparatuses for charged particle beam inspection Xuedong Liu, Qingpo Xi, Youfei Jiang, Weiming Ren, Xuerang Hu 2023-06-13
11664189 Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereof Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-05-30
11664186 Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction Wei FANG, Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-05-30
11593938 Rapid and automatic virus imaging and analysis system as well as methods thereof Xiaoming Chen, Daniel Tang, Liang-Fu Fan 2023-02-28
11587758 Apparatus of plural charged-particle beams Weiming Ren, Xuedong Liu, Xuerang Hu 2023-02-21