Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854763 | Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof | Wei FANG, Xiaoming Chen, Daniel Tang, Zhongwei Chen | 2023-12-26 |
| 11854762 | MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same | Wei FANG, Xiaoming Chen, Daniel Tang, Zhongwei Chen | 2023-12-26 |
| 11664186 | Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction | Zhongwei Chen, Wei FANG, Xiaoming Chen, Daniel Tang | 2023-05-30 |
| 11664189 | Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereof | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2023-05-30 |
| 11593938 | Rapid and automatic virus imaging and analysis system as well as methods thereof | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2023-02-28 |
| 11569059 | Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereof | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2023-01-31 |
| 11355312 | Stage driving system and apparatus or device such as apparatus of charged-particle beam comprising the same | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2022-06-07 |
| 11328898 | Digital detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2022-05-10 |
| 11295927 | Apparatus of charged-particle beam such as electron microscope comprising co-condensers for continuous image resolution tuning | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2022-04-05 |
| 11257659 | Electrode assembly, electronic apparatus/device using the same, and apparatus of charged-particle beam such as electron microscope using the same | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2022-02-22 |
| 11094499 | Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lens | Zhongwei Chen, Xiaoming Chen, Daniel Tang | 2021-08-17 |