Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854762 | MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same | Wei FANG, Xiaoming Chen, Liang-Fu Fan, Zhongwei Chen | 2023-12-26 |
| 11854763 | Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof | Wei FANG, Xiaoming Chen, Liang-Fu Fan, Zhongwei Chen | 2023-12-26 |
| 11664186 | Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction | Zhongwei Chen, Wei FANG, Xiaoming Chen, Liang-Fu Fan | 2023-05-30 |
| 11664189 | Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereof | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2023-05-30 |
| 11593938 | Rapid and automatic virus imaging and analysis system as well as methods thereof | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2023-02-28 |
| 11569059 | Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereof | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2023-01-31 |
| 11355312 | Stage driving system and apparatus or device such as apparatus of charged-particle beam comprising the same | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2022-06-07 |
| 11328898 | Digital detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2022-05-10 |
| 11295927 | Apparatus of charged-particle beam such as electron microscope comprising co-condensers for continuous image resolution tuning | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2022-04-05 |
| 11257659 | Electrode assembly, electronic apparatus/device using the same, and apparatus of charged-particle beam such as electron microscope using the same | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2022-02-22 |
| 11094499 | Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lens | Zhongwei Chen, Xiaoming Chen, Liang-Fu Fan | 2021-08-17 |
| 9450078 | Forming punch-through stopper regions in finFET devices | Zhimin Wan, Ching-I Li, Ger-Pin Lin | 2016-09-20 |
| 9209278 | Replacement source/drain finFET fabrication | Tzu-Shih Yen | 2015-12-08 |
| 9159810 | Doping a non-planar semiconductor device | Tzu-Shih Yen | 2015-10-13 |
| 9006065 | Plasma doping a non-planar semiconductor device | Tzu-Shih Yen, Tsungnan Cheng | 2015-04-14 |
| 8871584 | Replacement source/drain finFET fabrication | Tzu-Shih Yen | 2014-10-28 |
| 8685825 | Replacement source/drain finFET fabrication | Tzu-Shih Yen | 2014-04-01 |
| 8211784 | Method for manufacturing a semiconductor device with less leakage current induced by carbon implant | Jason Hong | 2012-07-03 |
| 6194784 | Self-aligned contact process in semiconductor fabrication and device therefrom | Krishna K. Parat, Glen Wada, Gregory E. Atwood | 2001-02-27 |
| 5731242 | Self-aligned contact process in semiconductor fabrication | Krishna K. Parat, Glen Wada, Gregory E. Atwood | 1998-03-24 |
| 5466624 | Isolation between diffusion lines in a memory array | Tong-Chern Ong | 1995-11-14 |
| 5229311 | Method of reducing hot-electron degradation in semiconductor devices | Stefan Lai, Simon Wang, Susan Kao, Baylor B. Triplett | 1993-07-20 |
| 5190887 | Method of making electrically erasable and electrically programmable memory cell with extended cycling endurance | Gregory E. Atwood | 1993-03-02 |
| 5120671 | Process for self aligning a source region with a field oxide region and a polysilicon gate | Wen-Juei Lu | 1992-06-09 |
| 5103274 | Self-aligned source process and apparatus | Wen-Juei Lu | 1992-04-07 |