Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12243711 | Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatus | Takahiro Nishihata, Yuji Takagi, Takuma Yamamoto, Yasutaka Toyoda | 2025-03-04 |
| 12176181 | Pattern inspecting device | Wei Sun, Takuma Yamamoto, Makoto Sakakibara | 2024-12-24 |
| 11626266 | Charged particle beam device | Keiichiro Hitomi, Kenji Tanimoto, Yusuke Abe, Takuma Yamamoto, Kei Sakai +2 more | 2023-04-11 |
| 10996569 | Measurement device, method and display device | Yuji Takagi, Fumihiko Fukunaga | 2021-05-04 |
| 10720307 | Electron microscope device and inclined hole measurement method using same | Yuji Takagi, Fumihiko Fukunaga | 2020-07-21 |
| 10692693 | System and method for measuring patterns | Wei Sun, Yasunari Sohda, Taku Ninomiya | 2020-06-23 |
| 10094658 | Overlay measurement method, device, and display device | Yuji Takagi, Fumihiko Fukunaga | 2018-10-09 |
| 9681848 | X-ray diagnostic system | Hiroaki Sato | 2017-06-20 |
| 9536700 | Sample observation device | Takuma Yamamoto | 2017-01-03 |
| 9507724 | Memory access processing method and information processing device | Hiroyuki Kamezawa, Yasuo Ueda, Tsutomu Itoh, Hideo Shitaya, Miyako Uchida +2 more | 2016-11-29 |
| 9390885 | Superposition measuring apparatus, superposition measuring method, and superposition measuring system | Takuma Yamamoto, Fumihiko Fukunaga | 2016-07-12 |
| 8905636 | X-ray diagnostic apparatus | Takeo Matsuzaki, Rie OCHIAI | 2014-12-09 |
| 7394070 | Method and apparatus for inspecting patterns | Mari Nozoe, Zhaohui Cheng | 2008-07-01 |
| 6797112 | Plasma treatment apparatus and method of producing semiconductor device using the apparatus | Naoshi Itabashi, Naoyuki Kofuji | 2004-09-28 |
| 6480574 | X-ray diagnostic apparatus | — | 2002-11-12 |