Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11310940 | Electronic device including radiation structure | Hong Ki Moon, Yoon-Sun PARK, Kyung-Ha Koo, In-Kuk Yun, Se Young Jang +1 more | 2022-04-19 |
| 11277118 | Variable gain phase shifter | Song Cheol Hong, Jin Seok Park, SEUNG HUN WANG | 2022-03-15 |
| 10848130 | Variable gain phase shifter | Song Cheol Hong, Jin Seok Park, SEUNG HUN WANG | 2020-11-24 |
| 10411348 | Phase shifting device | Jinseok Park, Song-Cheoll Hong, Jaehoon Chung, Minki Ahn | 2019-09-10 |
| 10171048 | Power amplifier | Gyu Suck KIM, Song Cheol Hong | 2019-01-01 |
| 9979362 | Power amplifier | Gyu Suck KIM, Song Cheol Hong | 2018-05-22 |
| 8507317 | Solder bump structure for flip chip semiconductor devices and method of manufacturing therefore | Mark A. Bachman, Donald S. Bitting, Sailesh Chittipeddi, Sailesh Mansinh Merchant | 2013-08-13 |
| 8319343 | Routing under bond pad for the replacement of an interconnect layer | Vance D. Archer, III, Michael AYUKAWA, Mark A. Bachman, Daniel Chesire, Taeho Kook +2 more | 2012-11-27 |
| 7973544 | Thermal monitoring and management of integrated circuits | Vance D. Archer, III, Daniel Chesire, Warren K. Gladden, Taeho Kook, Sailesh Mansinh Merchant +1 more | 2011-07-05 |
| 7952206 | Solder bump structure for flip chip semiconductor devices and method of manufacture therefore | Mark A. Bachman, Donald S. Bitting, Sailesh Chittipeddi, Sailesh Mansinh Merchant | 2011-05-31 |
| 7804291 | Semiconductor test device with heating circuit | Lisa Mullin, Subramanian Karthikeyan, Sailesh Mansinh Merchant | 2010-09-28 |
| 7566964 | Aluminum pad power bus and signal routing for integrated circuit devices utilizing copper technology interconnect structures | Roland Krebs, Kurt G. Steiner, Michael AYUKAWA, Sailesh Mansinh Merchant | 2009-07-28 |
| 7480874 | Reliability analysis of integrated circuits | Kausar Banoo, Shahriar Moinian, Blane A. Musser, John Anthony Pantone | 2009-01-20 |
| 7429502 | Integrated circuit device incorporating metallurgical bond to enhance thermal conduction to a heat sink | Vance D. Archer, III, Kouros Azimi, Daniel Chesire, Warren K. Gladden, Taeho Kook +2 more | 2008-09-30 |
| 7397103 | Semiconductor with damage detection circuitry | Vance D. Archer, III, Daniel Chesire, Taeho Kook, Sailesh Mansinh Merchant | 2008-07-08 |
| 7388395 | Test semiconductor device and method for determining Joule heating effects in such a device | Subramanian Karthikeyan, Sailesh Mansinh Merchant | 2008-06-17 |
| 7327029 | Integrated circuit device incorporating metallurigical bond to enhance thermal conduction to a heat sink | Vance D. Archer, III, Kouros Azimi, Daniel Chesire, Warren K. Gladden, Taeho Kook +2 more | 2008-02-05 |
| 7061264 | Test semiconductor device and method for determining Joule heating effects in such a device | Subramanian Karthikeyan, Sailesh Mansinh Merchant | 2006-06-13 |
| 6365503 | Method of improving electromigration in semiconductor device manufacturing processes | Jia-Sheng Huang, Anthony Oates, Yaw S. Obeng | 2002-04-02 |