Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7804291 | Semiconductor test device with heating circuit | Seung H. Kang, Lisa Mullin, Sailesh Mansinh Merchant | 2010-09-28 |
| 7388395 | Test semiconductor device and method for determining Joule heating effects in such a device | Seung H. Kang, Sailesh Mansinh Merchant | 2008-06-17 |
| 7301107 | Semiconductor device having reduced intra-level and inter-level capacitance | Sailesh Mansinh Merchant | 2007-11-27 |
| 7067419 | Mask layer and dual damascene interconnect structure in a semiconductor device | Robert Huang, Scott Jessen, Joshua Li, Isaiah O. Oladeji, Kurt G. Steiner +1 more | 2006-06-27 |
| 7061264 | Test semiconductor device and method for determining Joule heating effects in such a device | Seung H. Kang, Sailesh Mansinh Merchant | 2006-06-13 |
| 7005375 | Method to avoid copper contamination of a via or dual damascene structure | Sailesh Mansinh Merchant | 2006-02-28 |
| 6309900 | Test structures for testing planarization systems and methods for using same | Alvaro Maury, Frank Miceli | 2001-10-30 |