Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8775994 | Using entire area of chip in TDDB checking | Bonnie E. Weir | 2014-07-08 |
| 7480874 | Reliability analysis of integrated circuits | Seung H. Kang, Shahriar Moinian, Blane A. Musser, John Anthony Pantone | 2009-01-20 |