| 8875070 |
Breaking up long-channel field effect transistor into smaller segments for reliability modeling |
David A. Bell |
2014-10-28 |
| 8775994 |
Using entire area of chip in TDDB checking |
Kausar Banoo |
2014-07-08 |
| 8624352 |
Mitigation of detrimental breakdown of a high dielectric constant metal-insulator-metal capacitor in a capacitor bank |
Edward B. Harris, Ramnath Venkatraman |
2014-01-07 |
| 8241986 |
Semiconductor device and process for reducing damaging breakdown in gate dielectrics |
Taeho Kook, Tanya Nigam |
2012-08-14 |
| 8089130 |
Semiconductor device and process for reducing damaging breakdown in gate dielectrics |
Taeho Kook, Tanya Nigam |
2012-01-03 |
| 7898277 |
Hot-electronic injection testing of transistors on a wafer |
— |
2011-03-01 |
| 7332924 |
Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure |
Edward B. Harris |
2008-02-19 |
| 6043662 |
Detecting defects in integrated circuits |
Glenn B. Alers, Kathleen S. Krisch |
2000-03-28 |
| 5804975 |
Detecting breakdown in dielectric layers |
Glenn B. Alers, Kathleen S. Krisch |
1998-09-08 |