Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8875070 | Breaking up long-channel field effect transistor into smaller segments for reliability modeling | David A. Bell | 2014-10-28 |
| 8775994 | Using entire area of chip in TDDB checking | Kausar Banoo | 2014-07-08 |
| 8624352 | Mitigation of detrimental breakdown of a high dielectric constant metal-insulator-metal capacitor in a capacitor bank | Edward B. Harris, Ramnath Venkatraman | 2014-01-07 |
| 8241986 | Semiconductor device and process for reducing damaging breakdown in gate dielectrics | Taeho Kook, Tanya Nigam | 2012-08-14 |
| 8089130 | Semiconductor device and process for reducing damaging breakdown in gate dielectrics | Taeho Kook, Tanya Nigam | 2012-01-03 |
| 7898277 | Hot-electronic injection testing of transistors on a wafer | — | 2011-03-01 |
| 7332924 | Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure | Edward B. Harris | 2008-02-19 |
| 6043662 | Detecting defects in integrated circuits | Glenn B. Alers, Kathleen S. Krisch | 2000-03-28 |
| 5804975 | Detecting breakdown in dielectric layers | Glenn B. Alers, Kathleen S. Krisch | 1998-09-08 |