RF

Roy C. Flaker

IBM: 16 patents #6,952 of 70,183Top 10%
Overall (All Time): #300,098 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8093657 Circuit and methods to improve the operation of SOI devices Louis C. Hsu, Jente B. Kuang 2012-01-10
7405982 Methods to improve the operation of SOI devices Jente B. Kuang, Louis L. Hsu 2008-07-29
6410369 Soi-body selective link method and apparatus Louis L. Hsu, Fariborz Assaderaghi, Jack A. Mandelman 2002-06-25
6160292 Circuit and methods to improve the operation of SOI devices Louis L. Hsu, Jente B. Kuang 2000-12-12
6133608 SOI-body selective link method and apparatus Louis L. Hsu, Fariborz Assaderaghi, Jack A. Mandelman 2000-10-17
5740098 Using one memory to supply addresses to an associated memory during testing Robert Dean Adams, John Connor, James J. Covino, Garrett Stephen Koch, Alan L. Roberts +2 more 1998-04-14
5721863 Method and structure for accessing semi-associative cache memory using multiple memories to store different components of the address James J. Covino, Alan L. Roberts, Jose R. Sousa 1998-02-24
5715188 Method and apparatus for parallel addressing of CAMs and RAMs James J. Covino, Alan L. Roberts, Jose R. Sousa 1998-02-03
5604518 Memory structure with multiple integrated memory array portions Gregory J. Schroer, Roderick M. P. West, Todd Williams 1997-02-18
5592142 High speed greater than or equal to compare circuit R. Dean Adams, Donald Albert Evans 1997-01-07
5563833 Using one memory to supply addresses to an associated memory during testing Robert Dean Adams, John Connor, James J. Covino, Garrett Stephen Koch, Alan L. Roberts +2 more 1996-10-08
5101120 BiCMOS output driver Henry A. Bonges, III 1992-03-31
4782250 CMOS off-chip driver circuits Robert Dean Adams, Kenneth S. Gray, Howard L. Kalter 1988-11-01
4730122 Power supply adapter systems Jeffrey H. Dreibelbis, Erik L. Hedberg 1988-03-08
4719418 Defect leakage screen system Russell J. Houghton 1988-01-12
4404635 Programmable integrated circuit and method of testing the circuit before it is programmed 1983-09-13