Issued Patents All Time
Showing 1–25 of 114 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7903379 | Cascode I/O driver with improved ESD operation | Michael Chaine | 2011-03-08 |
| 7253064 | Cascode I/O driver with improved ESD operation | Michael Chaine | 2007-08-07 |
| 6888762 | Apparatus for reducing bleed currents within a DRAM array having row-to-column shorts | Brian M. Shirley | 2005-05-03 |
| 6882587 | Method of preparing to test a capacitor | Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2005-04-19 |
| 6809386 | Cascode I/O driver with improved ESD operation | Michael Chaine | 2004-10-26 |
| 6787400 | Electrostatic discharge protection device having a graded junction and method for forming the same | Stephen R. Porter, Stephen L. Casper, Kevin G. Duesman | 2004-09-07 |
| 6778452 | Circuit and method for voltage regulation in a semiconductor device | Kurt D. Beigel, Douglas J. Cutter, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more | 2004-08-17 |
| 6724033 | Fork-like memory structure for ULSI DRAM | Aaron Schoenfeld | 2004-04-20 |
| 6707096 | Fork-like memory structure for ULSI DRAM and method of fabrication | Aaron Schoenfeld | 2004-03-16 |
| 6699734 | Method and apparatus for coupling a semiconductor die to die terminals | Aaron Schoenfeld, Larry D. Kinsman, J. Mike Brooks, Timothy J. Allen | 2004-03-02 |
| 6682954 | Method for employing piggyback multiple die #3 | Jeffrey D. Bruce | 2004-01-27 |
| 6653220 | Advance metallization process | Trung T. Doan, Jeff Zhiqiang Wu | 2003-11-25 |
| 6631091 | Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts | Brian M. Shirley | 2003-10-07 |
| 6625068 | Apparatus for reducing bleed currents within a DRAM array having row-to-column shorts | Brian M. Shirley | 2003-09-23 |
| 6624660 | CMOS output driver for semiconductor device and related method for improving latch-up immunity in a CMOS output driver | Wen Li, Michael Chaine | 2003-09-23 |
| 6600687 | Method of compensating for a defect within a semiconductor device | Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2003-07-29 |
| 6600215 | Method and apparatus for coupling a semiconductor die to die terminals | Aaron Schoenfeld, Larry D. Kinsman, J. Mike Brooks, Timothy J. Allen | 2003-07-29 |
| 6593764 | Test socket and methods | Chris G. Martin | 2003-07-15 |
| 6593218 | Electrostatic discharge protection device having a graded junction and method for forming the same | Stephen R. Porter, Stephen L. Casper, Kevin G. Duesman | 2003-07-15 |
| 6586290 | Structure for ESD protection in semiconductor chips | Stephen L. Casper, Joseph C. Sher | 2003-07-01 |
| 6579746 | Method and apparatus for coupling a semiconductor die to die terminals | Aaron Schoenfeld, Larry D. Kinsman, J. Mike Brooks, Timothy J. Allen | 2003-06-17 |
| 6576960 | Electrostatic discharge protection device having a graded junction and method for forming the same | Stephen R. Porter, Stephen L. Casper, Kevin G. Duesman | 2003-06-10 |
| 6524922 | Semiconductor device having increased breakdown voltage and method of fabricating same | — | 2003-02-25 |
| 6518178 | Method for forming a field effect transistor having increased breakdown voltage | — | 2003-02-11 |
| 6507074 | Structure for ESD protection in semiconductor chips | Stephen L. Casper, Joseph C. Sher | 2003-01-14 |