Issued Patents All Time
Showing 25 most recent of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7152143 | Integrated semiconductor memory chip with presence detect data capability | Eric T. Stubbs | 2006-12-19 |
| 6947341 | Integrated semiconductor memory chip with presence detect data capability | Eric T. Stubbs | 2005-09-20 |
| 6882587 | Method of preparing to test a capacitor | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2005-04-19 |
| 6778452 | Circuit and method for voltage regulation in a semiconductor device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2004-08-17 |
| 6625692 | Integrated semiconductor memory chip with presence detect data capability | Eric T. Stubbs | 2003-09-23 |
| 6600687 | Method of compensating for a defect within a semiconductor device | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2003-07-29 |
| 6469944 | Method of compensating for a defect within a semiconductor device | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2002-10-22 |
| 6452846 | Driver circuit for a voltage-pulling device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2002-09-17 |
| 6445629 | Method of stressing a memory device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2002-09-03 |
| 6418071 | Method of testing a memory cell | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2002-07-09 |
| 6353564 | Method of testing a memory array | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2002-03-05 |
| 6335888 | Margin-range apparatus for a sense amp's voltage-pulling transistor | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2002-01-01 |
| 6235622 | Method and apparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connected to the substrate after manufacture | Lucien J. Bissey, Bryan Carson | 2001-05-22 |
| 6232148 | Method and apparatus leads-between-chips | Manny K. F. Ma, Jeffrey D. Bruce, Darryl L. Habersetzer, James E. Miller | 2001-05-15 |
| 6226210 | Method of detecting a short from a digit line pair to ground | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2001-05-01 |
| 6198676 | Test device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2001-03-06 |
| 6188622 | Method of identifying a defect within a memory circuit | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2001-02-13 |
| 6181617 | Method and apparatus for testing a semiconductor device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2001-01-30 |
| 6137119 | Apparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connecting the conductive region to the substrate after manufacture | Lucien J. Bissey, Bryan Carson | 2000-10-24 |
| 6111806 | Memory device with regulated power supply control | Brian M. Shirley, Manny K. F. Ma | 2000-08-29 |
| 6052322 | Memory circuit voltage regulator | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2000-04-18 |
| 6028799 | Memory circuit voltage regulator | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2000-02-22 |
| 6026040 | Method of altering the margin affecting a memory cell | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more | 2000-02-15 |
| 6011731 | Cell plate regulator | Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2000-01-04 |
| 6008533 | Controlling impedances of an integrated circuit | Jeffrey D. Bruce, Aaron Schoenfeld | 1999-12-28 |