Issued Patents All Time
Showing 25 most recent of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| PP27249 | Satsuma hybrid named ‘Sonet’ | Nicola Kim Combrink, Johannes Gerhardus Jooste Maritz | 2016-10-11 |
| 9406828 | Compact photovoltaic generation assembly and power supply | Stanley Mach | 2016-08-02 |
| 8637760 | Compact photovoltaic generation assembly and power supply | Stanley Mach | 2014-01-28 |
| 8281193 | Method of protecting a test circuit | — | 2012-10-02 |
| 8086920 | Method of controlling a test mode of a circuit | — | 2011-12-27 |
| 7615240 | Method and composition for the control of gastrointestinal parasites in animals | Jorge Mosjidis, Thomas H. Terrill, Joan M. Burke | 2009-11-10 |
| 7582826 | Compact photovoltaic generation assembly and power supply | Stanley Mach | 2009-09-01 |
| 7400544 | Actively driven VREF for input buffer noise immunity | Eric T. Stubbs | 2008-07-15 |
| 7376874 | Method of controlling a test mode of a circuit | — | 2008-05-20 |
| 6917230 | Low pass filters in DLL circuits | — | 2005-07-12 |
| 6898144 | Actively driven VREF for input buffer noise immunity | Eric T. Stubbs | 2005-05-24 |
| 6882587 | Method of preparing to test a capacitor | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2005-04-19 |
| 6791381 | Method and apparatus for reducing the lock time of a DLL | Eric T. Stubbs | 2004-09-14 |
| 6778452 | Circuit and method for voltage regulation in a semiconductor device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more | 2004-08-17 |
| 6760875 | Method of testing a circuit using an output vector | — | 2004-07-06 |
| 6664830 | Low pass filters in DLL circuits | — | 2003-12-16 |
| 6600687 | Method of compensating for a defect within a semiconductor device | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2003-07-29 |
| 6597619 | Actively driven VREF for input buffer noise immunity | Eric T. Stubbs | 2003-07-22 |
| 6591386 | Method to prevent inadvertent test mode entry | — | 2003-07-08 |
| 6469944 | Method of compensating for a defect within a semiconductor device | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2002-10-22 |
| 6452846 | Driver circuit for a voltage-pulling device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more | 2002-09-17 |
| 6445629 | Method of stressing a memory device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more | 2002-09-03 |
| 6441668 | Digital device with internal differential signal generator | — | 2002-08-27 |
| 6421800 | Circuit and method to prevent inadvertent test mode entry | — | 2002-07-16 |
| 6418071 | Method of testing a memory cell | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more | 2002-07-09 |