| PP27249 |
Satsuma hybrid named ‘Sonet’ |
Nicola Kim Combrink, Johannes Gerhardus Jooste Maritz |
2016-10-11 |
|
| 9406828 |
Compact photovoltaic generation assembly and power supply |
Stanley Mach |
2016-08-02 |
|
| 8637760 |
Compact photovoltaic generation assembly and power supply |
Stanley Mach |
2014-01-28 |
|
| 8281193 |
Method of protecting a test circuit |
— |
2012-10-02 |
$3,340,000 |
| 8086920 |
Method of controlling a test mode of a circuit |
— |
2011-12-27 |
$3,358,000 |
| 7615240 |
Method and composition for the control of gastrointestinal parasites in animals |
Jorge Mosjidis, Thomas H. Terrill, Joan M. Burke |
2009-11-10 |
|
| 7582826 |
Compact photovoltaic generation assembly and power supply |
Stanley Mach |
2009-09-01 |
|
| 7400544 |
Actively driven VREF for input buffer noise immunity |
Eric T. Stubbs |
2008-07-15 |
$1,858,000 |
| 7376874 |
Method of controlling a test mode of a circuit |
— |
2008-05-20 |
$2,269,000 |
| 6917230 |
Low pass filters in DLL circuits |
— |
2005-07-12 |
$2,176,000 |
| 6898144 |
Actively driven VREF for input buffer noise immunity |
Eric T. Stubbs |
2005-05-24 |
$1,184,000 |
| 6882587 |
Method of preparing to test a capacitor |
Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more |
2005-04-19 |
$902,000 |
| 6791381 |
Method and apparatus for reducing the lock time of a DLL |
Eric T. Stubbs |
2004-09-14 |
$1,322,000 |
| 6778452 |
Circuit and method for voltage regulation in a semiconductor device |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more |
2004-08-17 |
$1,525,000 |
| 6760875 |
Method of testing a circuit using an output vector |
— |
2004-07-06 |
$2,228,000 |
| 6664830 |
Low pass filters in DLL circuits |
— |
2003-12-16 |
$2,294,000 |
| 6600687 |
Method of compensating for a defect within a semiconductor device |
Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more |
2003-07-29 |
$3,127,000 |
| 6597619 |
Actively driven VREF for input buffer noise immunity |
Eric T. Stubbs |
2003-07-22 |
$3,963,000 |
| 6591386 |
Method to prevent inadvertent test mode entry |
— |
2003-07-08 |
$3,587,000 |
| 6469944 |
Method of compensating for a defect within a semiconductor device |
Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more |
2002-10-22 |
$4,725,000 |
| 6452846 |
Driver circuit for a voltage-pulling device |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more |
2002-09-17 |
$3,284,000 |
| 6445629 |
Method of stressing a memory device |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more |
2002-09-03 |
$3,391,000 |
| 6441668 |
Digital device with internal differential signal generator |
— |
2002-08-27 |
$3,113,000 |
| 6421800 |
Circuit and method to prevent inadvertent test mode entry |
— |
2002-07-16 |
$4,820,000 |
| 6418071 |
Method of testing a memory cell |
Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more |
2002-07-09 |
$4,358,000 |
