JM

James E. Miller

Micron: 55 patents #316 of 6,345Top 5%
UF US Air Force: 4 patents #1,661 of 16,312Top 15%
UA US Army: 2 patents #1,508 of 6,974Top 25%
AC Agricultural Research Council: 1 patents #7 of 20Top 35%
WE Westvaco: 1 patents #184 of 364Top 55%
UW U S West: 1 patents #51 of 183Top 30%
AU Auburn University: 1 patents #267 of 580Top 50%
MG Mediaone Group: 1 patents #35 of 139Top 30%
📍 Addo, FL: #1 of 1 inventorsTop 100%
Overall (All Time): #30,339 of 4,157,543Top 1%
69
Patents All Time

Issued Patents All Time

Showing 26–50 of 69 patents

Patent #TitleCo-InventorsDate
6392458 Method and apparatus for digital delay locked loop circuits Aaron Schoenfeld 2002-05-21
6388480 Method and apparatus for reducing the lock time of DLL Eric T. Stubbs 2002-05-14
6359482 Method and apparatus for digital delay locked loop circuits Aaron Schoenfeld 2002-03-19
6353564 Method of testing a memory array Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2002-03-05
6335888 Margin-range apparatus for a sense amp's voltage-pulling transistor Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more 2002-01-01
6316976 Method and apparatus for improving the performance of digital delay locked loop circuits Aaron Schoenfeld, Manny K. F. Ma, R. Jacob Baker 2001-11-13
6300668 High resistance integrated circuit resistor Manny K. F. Ma 2001-10-09
6289479 Circuit to prevent inadvertent test mode entry 2001-09-11
6281726 Device and method in a delay locked loop for generating quadrature and other off-phase clocks with improved resolution 2001-08-28
6232148 Method and apparatus leads-between-chips Manny K. F. Ma, Jeffrey D. Bruce, Darryl L. Habersetzer, Gordon D. Roberts 2001-05-15
6226210 Method of detecting a short from a digit line pair to ground Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2001-05-01
6198676 Test device Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more 2001-03-06
6188622 Method of identifying a defect within a memory circuit Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2001-02-13
6181617 Method and apparatus for testing a semiconductor device Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more 2001-01-30
6138258 Circuit and method to prevent inadvertent test mode entry 2000-10-24
6137334 Logic circuit delay stage and delay line utilizing same Aaron Schoenfeld 2000-10-24
6137325 Device and methods in a delay locked loop for generating quadrature and other off-phase clocks with improved resolution 2000-10-24
6069506 Method and apparatus for improving the performance of digital delay locked loop circuits Aaron Schoenfeld, Manny K. F. Ma, R. Jacob Baker 2000-05-30
6061430 Enhanced telephony system for premises monitoring Adam N. Marx 2000-05-09
6052322 Memory circuit voltage regulator Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more 2000-04-18
6028799 Memory circuit voltage regulator Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2000-02-22
6026040 Method of altering the margin affecting a memory cell Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer +2 more 2000-02-15
6011731 Cell plate regulator Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2000-01-04
5990538 High resistivity integrated circuit resistor Manny K. F. Ma 1999-11-23
5982687 Method of detecting leakage within a memory cell capacitor Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 1999-11-09