ES

Eric T. Stubbs

Micron: 43 patents #430 of 6,345Top 7%
Overall (All Time): #71,127 of 4,157,543Top 2%
43
Patents All Time

Issued Patents All Time

Showing 25 most recent of 43 patents

Patent #TitleCo-InventorsDate
7400544 Actively driven VREF for input buffer noise immunity James E. Miller 2008-07-15
7274605 Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM 2007-09-25
7152143 Integrated semiconductor memory chip with presence detect data capability Gordon D. Roberts 2006-12-19
7116589 Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM 2006-10-03
6959062 Variable delay line 2005-10-25
6947341 Integrated semiconductor memory chip with presence detect data capability Gordon D. Roberts 2005-09-20
6898144 Actively driven VREF for input buffer noise immunity James E. Miller 2005-05-24
6882587 Method of preparing to test a capacitor Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more 2005-04-19
6862224 System and method for operating a memory array 2005-03-01
6838712 Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM 2005-01-04
6791381 Method and apparatus for reducing the lock time of a DLL James E. Miller 2004-09-14
6778452 Circuit and method for voltage regulation in a semiconductor device Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more 2004-08-17
6727739 Compensation for a delay locked loop Christopher K. Morzano 2004-04-27
6667911 High speed memory architecture 2003-12-23
6636093 Compensation for a delay locked loop Christopher K. Morzano 2003-10-21
6625692 Integrated semiconductor memory chip with presence detect data capability Gordon D. Roberts 2003-09-23
6600687 Method of compensating for a defect within a semiconductor device Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more 2003-07-29
6597619 Actively driven VREF for input buffer noise immunity James E. Miller 2003-07-22
6581174 On-chip testing circuit and method for integrated circuits 2003-06-17
6570258 Method for reducing capacitive coupling between conductive lines Kin F. Ma 2003-05-27
6469944 Method of compensating for a defect within a semiconductor device Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more 2002-10-22
6452846 Driver circuit for a voltage-pulling device Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more 2002-09-17
6445629 Method of stressing a memory device Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more 2002-09-03
6418071 Method of testing a memory cell Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more 2002-07-09
6388480 Method and apparatus for reducing the lock time of DLL James E. Miller 2002-05-14