Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6353564 | Method of testing a memory array | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more | 2002-03-05 |
| 6335888 | Margin-range apparatus for a sense amp's voltage-pulling transistor | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2002-01-01 |
| 6286115 | On-chip testing circuit and method for integrated circuits | — | 2001-09-04 |
| 6259162 | Method for reducing capactive coupling between conductive lines | Kin F. Ma | 2001-07-10 |
| 6226210 | Method of detecting a short from a digit line pair to ground | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more | 2001-05-01 |
| 6198676 | Test device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2001-03-06 |
| 6188622 | Method of identifying a defect within a memory circuit | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more | 2001-02-13 |
| 6181617 | Method and apparatus for testing a semiconductor device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2001-01-30 |
| 6052322 | Memory circuit voltage regulator | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2000-04-18 |
| 6028799 | Memory circuit voltage regulator | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more | 2000-02-22 |
| 6026040 | Method of altering the margin affecting a memory cell | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2000-02-15 |
| 6011731 | Cell plate regulator | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more | 2000-01-04 |
| 5982687 | Method of detecting leakage within a memory cell capacitor | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more | 1999-11-09 |
| 5936974 | Circuit and method for testing an integrated circuit | Gordon D. Roberts, James E. Miller | 1999-08-10 |
| 5923672 | Multipath antifuse circuit | Gordon D. Roberts, Jeffrey D. Bruce, Kurt D. Beigel | 1999-07-13 |
| 5877993 | Memory circuit voltage regulator | Kurt D. Biegel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 1999-03-02 |
| 5854128 | Method for reducing capacitive coupling between conductive lines | Kin F. Ma | 1998-12-29 |
| 5787096 | Circuit and method for testing an integrated circuit | Gordon D. Roberts, James E. Miller | 1998-07-28 |