Issued Patents All Time
Showing 1–25 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6903991 | Circuit for programming antifuse bits | Patrick J. Mullarkey, Casey Kurth, Jason Graalum | 2005-06-07 |
| 6882587 | Method of preparing to test a capacitor | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2005-04-19 |
| 6834022 | Partial array self-refresh | Scott J. Derner, Casey Kurth | 2004-12-21 |
| 6826071 | Circuit for programming antifuse bits | Patrick J. Mullarkey, Casey Kurth, Jason Graalum | 2004-11-30 |
| 6778452 | Circuit and method for voltage regulation in a semiconductor device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2004-08-17 |
| 6661693 | Circuit for programming antifuse bits | Patrick J. Mullarkey, Casey Kurth, Jason Graalum | 2003-12-09 |
| 6650587 | Partial array self-refresh | Scott J. Derner, Casey Kurth | 2003-11-18 |
| 6646459 | Method for disabling and re-enabling access to IC test functions | Casey Kurth, Patrick J. Mullarkey, Jason Graalum | 2003-11-11 |
| 6600687 | Method of compensating for a defect within a semiconductor device | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2003-07-29 |
| 6590407 | Apparatus for disabling and re-enabling access to IC test functions | Casey Kurth, Patrick J. Mullarkey, Jason Graalum | 2003-07-08 |
| 6570400 | Method for disabling and re-enabling access to IC test functions | Casey Kurth, Patrick J. Mullarkey, Jason Graalum | 2003-05-27 |
| 6469944 | Method of compensating for a defect within a semiconductor device | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2002-10-22 |
| 6452846 | Driver circuit for a voltage-pulling device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2002-09-17 |
| 6445605 | Circuit for programming antifuse bits | Patrick J. Mullarkey, Casey Kurth, Jason Graalum | 2002-09-03 |
| 6445629 | Method of stressing a memory device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2002-09-03 |
| 6418071 | Method of testing a memory cell | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2002-07-09 |
| 6353564 | Method of testing a memory array | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2002-03-05 |
| 6335888 | Margin-range apparatus for a sense amp's voltage-pulling transistor | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2002-01-01 |
| 6255838 | Apparatus and method for disabling and re-enabling access to IC test functions | Casey Kurth, Patrick J. Mullarkey, Jason Graalum | 2001-07-03 |
| 6255837 | Apparatus and method disabling and re-enabling access to IC test functions | Casey Kurth, Patrick J. Mullarkey, Jason Graalum | 2001-07-03 |
| 6226210 | Method of detecting a short from a digit line pair to ground | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2001-05-01 |
| 6198676 | Test device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2001-03-06 |
| 6188622 | Method of identifying a defect within a memory circuit | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2001-02-13 |
| 6181617 | Method and apparatus for testing a semiconductor device | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2001-01-30 |
| 6160413 | Apparatus and method for disabling and re-enabling access to IC test functions | Casey Kurth, Patrick J. Mullarkey, Jason Graalum | 2000-12-12 |