Issued Patents All Time
Showing 26–40 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6130834 | Circuit for programming antifuse bits | Patrick J. Mullarkey, Casey Kurth, Jason Graalum | 2000-10-10 |
| 6055173 | Circuit for programming antifuse bits | Patrick J. Mullarkey, Casey Kurth, Jason Graalum | 2000-04-25 |
| 6052322 | Memory circuit voltage regulator | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2000-04-18 |
| 6028799 | Memory circuit voltage regulator | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2000-02-22 |
| 6026040 | Method of altering the margin affecting a memory cell | Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 2000-02-15 |
| 6011731 | Cell plate regulator | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 2000-01-04 |
| 5982687 | Method of detecting leakage within a memory cell capacitor | Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Jeffrey D. Bruce +1 more | 1999-11-09 |
| 5894165 | Leads between chips assembly | Manny K. F. Ma, Jeffrey D. Bruce, Gordon D. Roberts, James E. Miller | 1999-04-13 |
| 5877993 | Memory circuit voltage regulator | Kurt D. Biegel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more | 1999-03-02 |
| 5808897 | Integrated circuit device having interchangeable terminal connection | James E. Miller | 1998-09-15 |
| 5770480 | Method of leads between chips assembly | Manny K. F. Ma, Jeffrey D. Bruce, Gordon D. Roberts, James E. Miller | 1998-06-23 |
| 5721703 | Reprogrammable option select circuit | Casey Kurth, Patrick J. Mullarkey | 1998-02-24 |
| 5689455 | Circuit for programming antifuse bits | Patrick J. Mullarkey, Casey Kurth, Jason Graalum | 1997-11-18 |
| 5677567 | Leads between chips assembly | Manny K. F. Ma, Jeffrey D. Bruce, Gordon D. Roberts, James E. Miller | 1997-10-14 |
| 5627478 | Apparatus for disabling and re-enabling access to IC test functions | Casey Kurth, Patrick J. Mullarkey, Jason Graalum | 1997-05-06 |