MM

Manny K. F. Ma

📍 Boise, ID: #63 of 3,546 inventorsTop 2%
🗺 Idaho: #86 of 8,810 inventorsTop 1%
Overall (All Time): #11,133 of 4,157,543Top 1%
114
Patents All Time

Issued Patents All Time

Showing 26–50 of 114 patents

Patent #TitleCo-InventorsDate
6504396 Method for adjusting an output slew rate of a buffer Joseph C. Sher 2003-01-07
6472893 Test socket and methods Chris G. Martin 2002-10-29
6469944 Method of compensating for a defect within a semiconductor device Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2002-10-22
6452846 Driver circuit for a voltage-pulling device Kurt D. Beigel, Douglas J. Cutter, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more 2002-09-17
6444577 Method of fabricating a semiconductor device having increased breakdown voltage 2002-09-03
6445629 Method of stressing a memory device Kurt D. Beigel, Douglas J. Cutter, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more 2002-09-03
6442101 Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts Brian M. Shirley 2002-08-27
6434059 Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts Brian M. Shirley 2002-08-13
6418071 Method of testing a memory cell Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2002-07-09
6365937 Electrostatic discharge protection device having a graded junction Stephen R. Porter, Stephen L. Casper, Kevin G. Duesman 2002-04-02
6355508 Method for forming electrostatic discharge protection device having a graded junction Stephen R. Porter, Stephen L. Casper, Kevin G. Duesman 2002-03-12
6356250 Matrix addressable display with electrostatic discharge protection David A. Cathey, Glen E. Hush, Craig M. Dunham, David Zimlich 2002-03-12
6353564 Method of testing a memory array Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2002-03-05
6350634 Semiconductor device having a built-in heat sink and process of manufacturing same 2002-02-26
6340896 Test socket and methods Chris G. Martin 2002-01-22
6335888 Margin-range apparatus for a sense amp's voltage-pulling transistor Kurt D. Beigel, Douglas J. Cutter, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more 2002-01-01
6320781 Apparatus for minimization of data line coupling in a semiconductor memory device Wen Li 2001-11-20
6316976 Method and apparatus for improving the performance of digital delay locked loop circuits James E. Miller, Aaron Schoenfeld, R. Jacob Baker 2001-11-13
6310802 Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts Brian M. Shirley 2001-10-30
6303445 Method of ESD protection scheme 2001-10-16
6300788 Buffer with adjustable slew rate and a method of providing an adjustable slew rate Joseph C. Sher 2001-10-09
6300668 High resistance integrated circuit resistor James E. Miller 2001-10-09
6281109 Advance metallization process Trung T. Doan, Jeff Zhiqiang Wu 2001-08-28
6274482 Semiconductor processing methods of forming a contact opening Zhiqiang Wu, Alan R. Reinberg 2001-08-14
6266034 Matrix addressable display with electrostatic discharge protection David A. Cathey, Glen E. Hush, Craig M. Dunham, David Zimlich 2001-07-24