SC

Stephen L. Casper

Micron: 147 patents #75 of 6,345Top 2%
Overall (All Time): #6,404 of 4,157,543Top 1%
148
Patents All Time

Issued Patents All Time

Showing 25 most recent of 148 patents

Patent #TitleCo-InventorsDate
9633714 Methods for bias sensing in DRAM sense amplifiers through voltage-coupling/decoupling devices David J. McElroy 2017-04-25
8767496 Bias sensing in DRAM sense amplifiers through voltage-coupling/decoupling device David J. McElroy 2014-07-01
7995415 System and method for reducing power consumption during extended refresh periods of dynamic random access memory devices 2011-08-09
7903488 Bias sensing in DRAM sense amplifiers through voltage-coupling/decoupling device David J. McElroy 2011-03-08
7567477 Bias sensing in sense amplifiers through a voltage-coupling/decoupling device David J. McElroy 2009-07-28
7408828 System and method for reducing power consumption during extended refresh periods of dynamic random access memory devices 2008-08-05
7082073 System and method for reducing power consumption during extended refresh periods of dynamic random access memory devices 2006-07-25
7072235 Bias sensing in DRAM sense amplifiers through coupling and decoupling device David J. McElroy 2006-07-04
6954385 Method and apparatus for sensing resistive memory state Kevin G. Duesman, Glen E. Hush 2005-10-11
6922368 Apparatus and structure for rapid enablement 2005-07-26
RE38685 Data-output driver circuit and method 2005-01-11
6791885 Programmable conductor random access memory and method for sensing same Kevin G. Duesman, Glen E. Hush 2004-09-14
6787400 Electrostatic discharge protection device having a graded junction and method for forming the same Stephen R. Porter, Manny K. F. Ma, Kevin G. Duesman 2004-09-07
6778453 METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD OF MODIFYING OPERATION OF DYNAMIC RANDOM ACCESS MEMORY IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT Christopher B. Cooper, Ming-Bo Liu, Chris G. Martin, Troy A. Manning, Charles H. Dennison +3 more 2004-08-17
6760264 Apparatus and structure for rapid enablement 2004-07-06
6757202 Bias sensing in DRAM sense amplifiers David J. McElroy 2004-06-29
6714468 Circuit and method for testing a memory device 2004-03-30
6686796 Temperature compensated reference voltage circuit 2004-02-03
6633506 Antifuse detection circuit Chris G. Martin 2003-10-14
6625080 Antifuse detection circuit Chris G. Martin 2003-09-23
6593218 Electrostatic discharge protection device having a graded junction and method for forming the same Stephen R. Porter, Manny K. F. Ma, Kevin G. Duesman 2003-07-15
6586290 Structure for ESD protection in semiconductor chips Manny K. F. Ma, Joseph C. Sher 2003-07-01
6587892 Method of reducing data communication time 2003-07-01
6587978 Circuit and method for varying a pulse width of an internal control signal during a test mode Todd A. Merritt, George B. Raad 2003-07-01
6576960 Electrostatic discharge protection device having a graded junction and method for forming the same Stephen R. Porter, Manny K. F. Ma, Kevin G. Duesman 2003-06-10