MD

Maxime Darnon

IBM: 16 patents #6,952 of 70,183Top 10%
CEA: 2 patents #2,014 of 7,956Top 30%
Applied Materials: 2 patents #3,641 of 7,310Top 50%
CN CNRS: 1 patents #3,857 of 11,908Top 35%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
UA Universite Grenoble Alpes: 1 patents #96 of 431Top 25%
CS Cnrs-Centre National De La Recherche Scientifique: 1 patents #33 of 140Top 25%
Overall (All Time): #222,572 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10319870 Photovoltaic module with a controllable infrared protection layer Lawrence A. Clevenger, Timothy J. Dalton, Rainer Krause, Gerd Pfeiffer, Kevin M. Prettyman +2 more 2019-06-11
10056266 Method for manufacturing a resistive device for a memory or logic circuit Bernard Dieny, Gabriele Navarro, Olivier Joubert 2018-08-21
9123652 Multi-level autolimitating etching method Olivier Desplats, Thierry Chevolleau, Cecile Gourgon 2015-09-01
9059249 Interconnect structures containing a photo-patternable low-k dielectric with a curved sidewall surface Qinghuang Lin 2015-06-16
8956886 Embedded test structure for trimming process control Samer Banna, Olivier Joubert, Lei Lian, Nicolas Posseme, Laurent Vallier 2015-02-17
8952539 Methods for fabrication of an air gap-containing interconnect structure Lawrence A. Clevenger, Satyanarayana V. Nitta, Anthony D. Lisi, Qinghuang Lin 2015-02-10
8896120 Structures and methods for air gap integration Lawrence A. Clevenger, Qinghuang Lin, Anthony D. Lisi, Satyanarayana V. Nitta 2014-11-25
8853856 Methodology for evaluation of electrical characteristics of carbon nanotubes Gerald W. Gibson, Pratik P. Joshi, Qinghuang Lin 2014-10-07
8828749 Methodology for evaluation of electrical characteristics of carbon nanotubes Gerald W. Gibson, Pratik P. Joshi, Qinghuang Lin 2014-09-09
8642252 Methods for fabrication of an air gap-containing interconnect structure Lawrence A. Clevenger, Satyanarayana V. Nitta, Anthony D. Lisi, Qinghuang Lin 2014-02-04
8637395 Methods for photo-patternable low-k (PPLK) integration with curing after pattern transfer Qinghuang Lin 2014-01-28
8629561 Air gap-containing interconnect structure having photo-patternable low k material Lawrence A. Clevenger, Qinghuang Lin, Anthony D. Lisi, Satyanarayana V. Nitta 2014-01-14
8546263 Method of patterning of magnetic tunnel junctions Olivier Joubert, Benjamin Schwarz, Jérémy Gilbert Maurice Pereira, Kevin Menguelti, Erwine Maude Pargon 2013-10-01
8475667 Method of patterning photosensitive material on a substrate containing a latent acid generator Pratik P. Joshi, Qinghuang Lin 2013-07-02
8449781 Selective etch back process for carbon nanotubes intergration Gerald W. Gibson, Pratik P. Joshi, Ryan M. Martin, Ying Zhang 2013-05-28
8298937 Interconnect structure fabricated without dry plasma etch processing Jeffrey P. Gambino, Elbert E. Huang, Qinghuang Lin 2012-10-30
8241992 Method for air gap interconnect integration using photo-patternable low k material Lawrence A. Clevenger, Qinghuang Lin, Anthony D. Lisi, Satyanarayana V. Nitta 2012-08-14
8183694 Reversing tone of patterns on integrated circuit and nanoscale fabrication Lawrence A. Clevenger, Anthony D. Lisi, Satya V. Nitta 2012-05-22
7939446 Process for reversing tone of patterns on integerated circuit and structural process for nanoscale fabrication Lawrence A. Clevenger, Anthony D. Lisi, Satya V. Nitta 2011-05-10
7790601 Forming interconnects with air gaps Samuel S. Choi, Lawrence A. Clevenger, Daniel C. Edelstein, Satyanarayana V. Nitta, Shom Ponoth +1 more 2010-09-07