Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11791130 | Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device | Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Makoto Sakakibara +4 more | 2023-10-17 |
| 11170969 | Electron beam observation device, electron beam observation system, and control method of electron beam observation device | Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Makoto Sakakibara +2 more | 2021-11-09 |
| 9702695 | Image processing device, charged particle beam device, charged particle beam device adjustment sample, and manufacturing method thereof | Hiroki Kawada, Osamu Inoue, Miyako Matsui, Takahiro Kawasaki, Naoshi Itabashi +2 more | 2017-07-11 |
| 9275829 | Image forming device and computer program | Osamu Komuro | 2016-03-01 |
| 7611993 | Plasma processing method and plasma processing apparatus | Tetsuo Ono, Hideyuki Yamamoto | 2009-11-03 |
| 7381951 | Charged particle beam adjustment method and apparatus | Takashi Doi, Noriaki Arai, Hidetoshi Morokuma, Fumihiro Sasajima, Maki Tanaka +1 more | 2008-06-03 |
| 6888094 | Plasma processing method and plasma processing apparatus | Tetsuo Ono, Hideyuki Yamamoto | 2005-05-03 |
| 6700090 | Plasma processing method and plasma processing apparatus | Tetsuo Ono, Hideyuki Yamamoto | 2004-03-02 |