Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11869783 | Optimizating semiconductor binning by feed-forward process adjustment | Benjamin D. Briggs, Lawrence A. Clevenger, Nicholas Anthony Lanzillo, Michael Rizzolo, Theodorus E. Standaert | 2024-01-09 |
| 11391051 | Contour spackle knife | — | 2022-07-19 |
| 11105856 | Detection of performance degradation in integrated circuits | Emily A. Ray, Emmanuel Yashchin, Peilin Song, Kevin G. Stawiasz, Barry P. Linder +4 more | 2021-08-31 |
| 11049744 | Optimizing semiconductor binning by feed-forward process adjustment | Benjamin D. Briggs, Lawrence A. Clevenger, Nicholas Anthony Lanzillo, Michael Rizzolo, Theodorus E. Standaert | 2021-06-29 |
| 10830841 | Magnetic tunnel junction performance monitoring based on magnetic field coupling | Nicholas Anthony Lanzillo, Benjamin D. Briggs, Michael Rizzolo, Lawrence A. Clevenger, Theodorus E. Standaert | 2020-11-10 |
| 10796833 | Magnetic tunnel junction with low series resistance | Nicholas Anthony Lanzillo, Benjamin D. Briggs, Michael Rizzolo, Theodorus E. Standaert, Lawrence A. Clevenger | 2020-10-06 |
| 10746782 | Accelerated wafer testing using non-destructive and localized stress | Benjamin D. Briggs, Lawrence A. Clevenger, Nicholas Anthony Lanzillo, Michael Rizzolo, Theodorus E. Standaert | 2020-08-18 |
| 10739397 | Accelerated wafer testing using non-destructive and localized stress | Benjamin D. Briggs, Lawrence A. Clevenger, Nicholas Anthony Lanzillo, Michael Rizzolo, Theodorus E. Standaert | 2020-08-11 |
| 10574240 | Ring oscillator structures to determine local voltage value | Keith A. Jenkins, Peilin Song, Franco Stellari | 2020-02-25 |
| 10552278 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more | 2020-02-04 |
| 10125533 | Small frangible shim | — | 2018-11-13 |
| 10103060 | Test structures for dielectric reliability evaluations | David G. Brochu, JR., Roger A. Dufresne, Baozhen Li, Barry P. Linder, Ernest Y. Wu | 2018-10-16 |
| 10102090 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more | 2018-10-16 |
| 9287185 | Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations | Griselda Bonilla, Baozhen Li, Barry P. Linder, Ernest Y. Wu, Kai Zhao | 2016-03-15 |
| 9026981 | Dielectric reliability assessment for advanced semiconductors | Baozhen Li, Ernest Y. Wu | 2015-05-05 |
| 8839180 | Dielectric reliability assessment for advanced semiconductors | Baozhen Li, Ernest Y. Wu | 2014-09-16 |
| 6602772 | Method for non-contact stress evaluation of wafer gate dielectric reliability | Wagdi W. Abadeer, Eduard A. Cartier | 2003-08-05 |
| 6326732 | Apparatus and method for non-contact stress evaluation of wafer gate dielectric reliability | Wagdi W. Abadeer, Eduard A. Cartier | 2001-12-04 |