IM

Ivan Maleev

KL Kla-Tencor: 10 patents #144 of 1,394Top 15%
TL Tokyo Electron Limited: 6 patents #1,241 of 5,567Top 25%
KL Kla: 2 patents #202 of 758Top 30%
Google: 1 patents #14,769 of 22,993Top 65%
📍 Fremont, CA: #872 of 9,298 inventorsTop 10%
🗺 California: #30,698 of 386,348 inventorsTop 8%
Overall (All Time): #230,829 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
12360463 Fiber bundle based optical spot size selector 2025-07-15
11989876 Method and apparatus for inspecting pattern collapse defects Shin-Yee Lu 2024-05-21
11676266 Method and apparatus for inspecting pattern collapse defects Shin-Yee Lu 2023-06-13
11664283 Raman sensor for supercritical fluids metrology 2023-05-30
11415725 System, method and apparatus for polarization control Donald Pettibone 2022-08-16
11385154 Apparatus and method for monitoring and measuring properties of polymers in solutions Ching-Ling Meng 2022-07-12
10921488 System, method and apparatus for polarization control Donald Pettibone 2021-02-16
10837902 Optical sensor for phase determination Mihail Mihaylov, Hanyou Chu, Ching-Ling Meng, Qionglin Gao, Yan Chen +1 more 2020-11-17
10564714 Systems and methods for biomechanically-based eye signals for interacting with real and virtual objects Lewis James Marggraff, Nelson George Publicover, Spencer James Connaughton, Nathan Lord, Peter Milford 2020-02-18
10488348 Wafer inspection Anatoly Romanovsky, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll, Stephen Biellak +2 more 2019-11-26
9995850 System, method and apparatus for polarization control Donald Pettibone 2018-06-12
9915622 Wafer inspection Anatoly Romanovsky, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll, Stephen Biellak +2 more 2018-03-13
9891177 TDI sensor in a darkfield system Jijen Vazhaeparambil, Guoheng Zhao, Daniel Kavaldjiev, Anatoly Romanovsky, Christian Wolters +5 more 2018-02-13
9494531 Multi-spot illumination for improved detection sensitivity Yung-Ho Alex Chuang, Xiaoxu Lu, John Fielden 2016-11-15
9377416 Wafer edge detection and inspection Venkata Raghavaiah Chowdhary Kode 2016-06-28
9279774 Wafer inspection Anatoly Romanovsky, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll, Stephen Biellak +2 more 2016-03-08
9182341 Optical surface scanning systems and methods 2015-11-10
9076639 Transmissive-reflective photocathode 2015-07-07
8502977 Angular resolved spectroscopic scatterometer 2013-08-06