Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400827 | Charged particle beam device | Teruo Kohashi, Tatsuro Ide, Junichi Katane | 2025-08-26 |
| 12334297 | Electron gun and electron beam application device | Takashi Ohshima, Yoichi Ose, Toshihide Agemura, Makoto Kuwahara | 2025-06-17 |
| 12217928 | Electron gun and electron microscope | Takashi Ohshima, Tatsuro Ide, Naohiro Kohmu, Toshihide Agemura, Yoichi Ose +1 more | 2025-02-04 |
| 12165828 | Electron gun and electron beam application apparatus | Takashi Ohshima, Tatsuro Ide, Naohiro Kohmu, Momoyo Enyama, Yoichi Ose +2 more | 2024-12-10 |
| 11961699 | Charged particle beam device | Teruo Kohashi, Hiroyuki Yamamoto, Junichi Katane | 2024-04-16 |
| 11784022 | Electron beam apparatus | Takashi Ohshima, Tatsuro Ide, Yoichi Ose, Tsunenori Nomaguchi, Toshihide Agemura | 2023-10-10 |
| 11756763 | Scanning electron microscope | Teruo Kohashi, Junichi Katane | 2023-09-12 |
| 11189457 | Scanning electron microscope | Toshihide Agemura | 2021-11-30 |
| 11170972 | Scanning electron microscope and method for analyzing secondary electron spin polarization | Teruo Kohashi, Junichi Katane | 2021-11-09 |
| 11139143 | Spin polarimeter | Teruo Kohashi, Toshihide Agemura | 2021-10-05 |
| 10886101 | Charged particle beam device | Ryo HIRANO, Toshihide Agemura, Junichi Katane, Tsunenori Nomaguchi | 2021-01-05 |
| 10262830 | Scanning electron microscope and electron trajectory adjustment method therefor | Daisuke Bizen, Michio Hatano, Hiroya Ohta | 2019-04-16 |
| 10241062 | Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member | Yusuke Ominami, Mitsugu Sato, Kenko Uchida, Sadamitsu Aso, Taku Sakazume +2 more | 2019-03-26 |
| 10014151 | Composite charged particle beam device | Yuta Imai, Toshihide Agemura | 2018-07-03 |
| 9812288 | Sample holder with light emitting and transferring elements for a charged particle beam apparatus | Minami Shouji, Takashi Ohshima, Yuusuke OOMINAMI, Kunio Harada | 2017-11-07 |
| 9570268 | Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun | Yuta Imai, Takashi Ohshima | 2017-02-14 |
| 9536703 | Scanning electron microscope | Toshihide Agemura | 2017-01-03 |
| 9208994 | Electron beam apparatus for visualizing a displacement of an electric field | Takashi Ohshima, Michio Hatano | 2015-12-08 |
| 9029766 | Scanning electron microscope | Takashi Ohshima, Michio Hatano, Sukehiro Ito | 2015-05-12 |
| 8629395 | Charged particle beam apparatus | Michio Hatano, Takashi Ohshima, Mitsugu Sato, Tetsuya Sawahata, Sukehiro Ito +1 more | 2014-01-14 |