Issued Patents All Time
Showing 25 most recent of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9150962 | Method for producing substrate with metal body | Tatsuya Sakai, Hideki Nishimura, Masahiro Yamamoto, Hisashi Nakagawa, Ryuuichi Saitou +1 more | 2015-10-06 |
| 8496470 | Injection molding die for producing a molded product having an appearance surface | — | 2013-07-30 |
| 8298652 | Injection molding die for producing molded product having appearance surface, injection molding method for producing molded product having appearance surface, and resin molded product molded by the injection molding method | — | 2012-10-30 |
| 7356742 | Method and apparatus for testing a memory device in quasi-operating conditions | Takeshi Wada, Masaaki Namba, Noboru Uchida, Shigeki Katsumi, Yuji Wada +1 more | 2008-04-08 |
| 7341133 | Hydraulic circuit and hydraulic control unit for hydraulic power transmission | Masahiko Ando, Hiroyuki Tsukamoto, Akira Fukatsu, Atsushi Mori, Akira Matsuo +1 more | 2008-03-11 |
| 7225372 | Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory | Iwao Suzuki, Shuji Kikuchi, Fumie Kobayashi | 2007-05-29 |
| 7200394 | Information distribution service system based on predicted changes in location of mobile information terminal | Norio Murakami | 2007-04-03 |
| 7024604 | Process for manufacturing semiconductor device | — | 2006-04-04 |
| 7018857 | Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe | Masatoshi Kanamaru, Takanori Aono, Tatsuya Nagata, Kenji Kawakami | 2006-03-28 |
| 6978295 | Server apparatus for space information service, space information service providing method, and charge processing apparatus and charging method for space information service | Yoshinobu Meifu, Keiji Mizuma | 2005-12-20 |
| 6955870 | Method of manufacturing a semiconductor device | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu | 2005-10-18 |
| 6952110 | Testing apparatus for carrying out inspection of a semiconductor device | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu | 2005-10-04 |
| 6885208 | Semiconductor device and test device for same | Toshio Miyatake, Tatsuya Nagata, Hiroya Shimizu, Ryuji Kohno | 2005-04-26 |
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno, Hiroya Shimizu +1 more | 2004-12-07 |
| 6826720 | Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory | Iwao Suzuki, Shuji Kikuchi, Fumie Kobayashi | 2004-11-30 |
| 6774654 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more | 2004-08-10 |
| 6714030 | Semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2004-03-30 |
| 6660541 | Semiconductor device and a manufacturing method thereof | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno | 2003-12-09 |
| 6573112 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more | 2003-06-03 |
| 6566149 | Method for manufacturing substrate for inspecting semiconductor device | Masatoshi Kanamaru, Atsushi Hosogane, Yoshihige Endou, Ryuji Kouno, Hideo Miura +4 more | 2003-05-20 |
| 6548315 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2003-04-15 |
| 6531327 | Method for manufacturing semiconductor device utilizing semiconductor testing equipment | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Ryuji Kohno +1 more | 2003-03-11 |
| 6507204 | Semiconductor testing equipment with probe formed on a cantilever of a substrate | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Ryuji Kohno +1 more | 2003-01-14 |
| 6496023 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more | 2002-12-17 |
| 6479305 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more | 2002-11-12 |