Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387310 | Wafer signature local maxima via clustering for metrology guided inspection | Alan Davila, Marcus Liesching, Sandeep Bhagwat, Surya Vanamali, Suresh Selvaraj +3 more | 2025-08-12 |
| 11055840 | Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection | Martin Plihal, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sandeep Bhagwat | 2021-07-06 |
| 10209628 | System and method for defect classification based on electrical design intent | Prasanti Uppaluri, Thirupurasundari Jayaraman, Srikanth Kandukuri, Sagar A. Kekare | 2019-02-19 |
| 9835566 | Adaptive nuisance filter | Martin Plihal, Raghav Babulnath, Sankar Venkataraman | 2017-12-05 |
| 8204296 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Kris Bhaskar, Mark A. McCord, Santosh Bhattacharyya, Richard Wallingford, Hubert Altendorfer +1 more | 2012-06-19 |
| 7796804 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Kris Bhaskar, Mark A. McCord, Santosh Bhattacharyya, Richard Wallingford, Hubert Altendorfer +1 more | 2010-09-14 |
| 7345753 | Apparatus and methods for analyzing defects on a sample | Kris Bhaskar, Michael J. Van Riet | 2008-03-18 |