Issued Patents All Time
Showing 76–87 of 87 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6662324 | Global transition scan based AC method | Franco Motika, Richard F. Rizzolo, Peilin Song, Ulrich Baur | 2003-12-09 |
| 6629280 | Method and apparatus for delaying ABIST start | Timothy J. Koprowski, Timothy G. McNamara, Pradip Patel | 2003-09-30 |
| 6629281 | Method and system for at speed diagnostics and bit fail mapping | Timothy G. McNamara, Timothy J. Koprowski | 2003-09-30 |
| 6625769 | Method for IC fault analysis using programmable built-in self test and optical emission | Moyra K. Mc Manus, Pia Naoko Sanda | 2003-09-23 |
| 6314540 | Partitioned pseudo-random logic test for improved manufacturability of semiconductor chips | Mary P. Kusko, Gregory O'Malley, Bryan J. Robbins | 2001-11-06 |
| 6311311 | Multiple input shift register (MISR) signatures used on architected registers to detect interim functional errors on instruction stream test | Scott Barnett Swaney, Bruce Wile | 2001-10-30 |
| 6125465 | Isolation/removal of faults during LBIST testing | Timothy G. McNamara, Timothy J. Koprowski | 2000-09-26 |
| 5805789 | Programmable computer system element with built-in self test method and apparatus for repair during power-on | Tin-Chee Lo, Pradip Patel, Timothy J. Slegel | 1998-09-08 |
| 5661732 | Programmable ABIST microprocessor for testing arrays with two logical views | Tin-Chee Lo | 1997-08-26 |
| 5659551 | Programmable computer system element with built-in self test method and apparatus for repair during power-on | Tin-Chee Lo, Pradip Patel, Timothy J. Slegel | 1997-08-19 |
| 5633877 | Programmable built-in self test method and controller for arrays | Philip G. Shephard, III, Paul R. Turgeon, Robert W. Berry, Jr., Gulsun Yasar, Frederick J. Cox +2 more | 1997-05-27 |
| 5420467 | Programmable delay clock chopper/stretcher with fast recovery | Timothy G. McNamara | 1995-05-30 |