Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6909295 | Analysis methods of leakage current luminescence in CMOS circuits | Stanislav Polonsky, Alan J. Weger | 2005-06-21 |
| 6625769 | Method for IC fault analysis using programmable built-in self test and optical emission | William V. Huott, Pia Naoko Sanda | 2003-09-23 |