Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11430748 | Inspection and identification to enable secure chip processing | Effendi Leobandung | 2022-08-30 |
| 10090197 | Aggressive tip-to-tip scaling using subtractive integration | Veeraraghavan S. Basker | 2018-10-02 |
| 9793160 | Aggressive tip-to-tip scaling using subtractive integraton | Veeraraghavan S. Basker | 2017-10-17 |
| 9787473 | Carbon nanotube array for cryptographic key generation and protection | Shu-Jen Han, Keith A. Jenkins, Dirk Pfeiffer | 2017-10-10 |
| 9660806 | Carbon nanotube array for cryptographic key generation and protection | Shu-Jen Han, Keith A. Jenkins, Dirk Pfeiffer | 2017-05-23 |
| 9608099 | Nanowire semiconductor device | Effendi Leobandung, Tenko Yamashita | 2017-03-28 |
| 9362177 | Nanowire semiconductor device | Effendi Leobandung, Tenko Yamashita | 2016-06-07 |
| 9312358 | Partially-blocked well implant to improve diode ideality with SiGe anode | Dechao Guo, Gan Wang, Yanfeng Wang, Xin Wang | 2016-04-12 |
| 9252234 | Partially-blocked well implant to improve diode ideality with SiGe anode | Dechao Guo, Gan Wang, Yanfeng Wang, Xin Wang | 2016-02-02 |
| 9203041 | Carbon nanotube transistor having extended contacts | Shu-Jen Han, James B. Hannon | 2015-12-01 |
| 9105725 | Semiconductor-on-insulator device including stand-alone well implant to provide junction butting | Dechao Guo, Gan Wang, Xin Wang, Yanfeng Wang, Keith Kwong Hon Wong | 2015-08-11 |
| 9064739 | Techniques for quantifying fin-thickness variation in FINFET technology | Chung-Hsun Lin, Philip J. Oldiges, Kern Rim | 2015-06-23 |
| 9059212 | Back-end transistors with highly doped low-temperature contacts | Bahman Hekmatshoar-Tabari, Ali Khakifirooz, Tak H. Ning, Ghavam G. Shahidi, Davood Shahrjerdi | 2015-06-16 |
| 9059291 | Semiconductor-on-insulator device including stand-alone well implant to provide junction butting | Dechao Guo, Gan Wang, Xin Wang, Yanfeng Wang, Keith Kwong Hon Wong | 2015-06-16 |
| 8969187 | Self-aligned contacts | Dechao Guo, Shu-Jen Han, Chung-Hsun Lin | 2015-03-03 |
| 8940558 | Techniques for quantifying fin-thickness variation in FINFET technology | Chung-Hsun Lin, Philip J. Oldiges, Kern Rim | 2015-01-27 |
| 8901626 | Self-aligned contacts for field effect transistor devices | Dechao Guo, Xinhui Wang, Keith Kwong Hon Wong | 2014-12-02 |
| 8546920 | Semiconductor-on-insulator (SOI) structures including gradient nitrided buried oxide (BOX) | Anthony I. Chou, Toshiharu Furukawa, Zhibin Ren, Dinkar Singh, Jeffrey W. Sleight | 2013-10-01 |
| 8445371 | Self-aligned contacts | Dechao Guo, Shu-Jen Han, Chung-Hsun Lin | 2013-05-21 |
| 8367508 | Self-aligned contacts for field effect transistor devices | Dechao Guo, Xinhui Wang, Keith Kwong Hon Wong | 2013-02-05 |
| 8288826 | Semiconductor-on-insulator (SOI) structures including gradient nitrided buried oxide (BOX) | Anthony I. Chou, Toshiharu Furukawa, Zhibin Ren, Dinkar Singh, Jeffrey W. Sleight | 2012-10-16 |
| 8053373 | Semiconductor-on-insulator(SOI) structures including gradient nitrided buried oxide (BOX) | Anthony I. Chou, Toshiharu Furukawa, Zhibin Ren, Dinkar Singh, Jeffrey W. Sleight | 2011-11-08 |
| 7729159 | Apparatus for improved SRAM device performance through double gate topology | George M. Braceras, Joseph A. Iadanza | 2010-06-01 |
| 7479410 | Hybrid-orientation technology buried n-well design | Edward J. Nowak | 2009-01-20 |
| 7408800 | Apparatus and method for improved SRAM device performance through double gate topology | George M. Braceras, Joseph A. Iadanza | 2008-08-05 |