HY

Haining Yang

IBM: 198 patents #164 of 70,183Top 1%
QU Qualcomm: 49 patents #499 of 12,104Top 5%
Micron: 14 patents #1,151 of 6,345Top 20%
CM Chartered Semiconductor Manufacturing: 4 patents #148 of 840Top 20%
Infineon Technologies Ag: 3 patents #2,452 of 7,486Top 35%
Samsung: 2 patents #37,631 of 75,807Top 50%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
UH University Of Hawaii: 2 patents #65 of 367Top 20%
CL Cambridge Enterprise Limited: 2 patents #106 of 688Top 20%
Huawei: 1 patents #8,196 of 15,535Top 55%
RU Rice University: 1 patents #21 of 77Top 30%
NU New York University: 1 patents #708 of 1,640Top 45%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
📍 San Diego, CA: #74 of 23,606 inventorsTop 1%
🗺 California: #277 of 386,348 inventorsTop 1%
Overall (All Time): #1,575 of 4,157,543Top 1%
276
Patents All Time

Issued Patents All Time

Showing 126–150 of 276 patents

Patent #TitleCo-InventorsDate
7868461 Embedded interconnects, and methods for forming same Thomas W. Dyer 2011-01-11
7863653 Method of enhancing hole mobility Henry K. Utomo, Judson R. Holt 2011-01-04
7863186 Fully and uniformly silicided gate structure and method for forming same Wai-Kin Li 2011-01-04
7863646 Dual oxide stress liner Michael P. Belyansky, Xiangdong Chen, Thomas W. Dyer, Geng Wang 2011-01-04
7859044 Partially gated FINFET with gate dielectric on only one sidewall Robert C. Wong 2010-12-28
7851885 Methods and systems involving electrically programmable fuses Deok-kee Kim, Keith Kwong Hon Wong, Chih-Chao Yang 2010-12-14
7842940 Structure and method to form semiconductor-on-pores (SOP) for high device performance and low manufacturing cost Joel P. de Souza, Keith E. Fogel, Brian J. Greene, Devendra K. Sadana 2010-11-30
7834387 Metal gate compatible flash memory gate stack Roger A. Booth, Jr., Deok-kee Kim, Xiaojun Yu 2010-11-16
7825490 Electrical fuse having a cavity thereupon Deok-kee Kim, Wai-Kin Li 2010-11-02
7816231 Device structures including backside contacts, and methods for forming same Thomas W. Dyer 2010-10-19
7816219 Field effect transistors (FETs) with multiple and/or staircase silicide Xiangdong Chen, Sunfei Fang, Zhijiong Luo, Huilong Zhu 2010-10-19
7808082 Structure and method for dual surface orientations for CMOS transistors Thomas W. Dyer, Keith Kwong Hon Wong, Chih-Chao Yang 2010-10-05
7790558 Method and apparatus for increase strain effect in a transistor channel Huilong Zhu 2010-09-07
7791109 Metal silicide alloy local interconnect Clement Wann 2010-09-07
7790577 Crackstop structures and methods of making same Xiao Hu Liu, Chih-Chao Yang 2010-09-07
7790540 Structure and method to use low k stress liner to reduce parasitic capacitance Wai-Kin Li 2010-09-07
7790542 CMOS devices having reduced threshold voltage variations and methods of manufacture thereof Thomas W. Dyer 2010-09-07
7785937 Electrical fuse having sublithographic cavities thereupon Deok-kee Kim, Wai-Kin Li 2010-08-31
7786527 Sub-lithographic gate length transistor using self-assembling polymers Wai-Kin Li 2010-08-31
7781847 Device patterned with sub-lithographic features with variable widths 2010-08-24
7777297 Non-planar fuse structure including angular bend Wai-Kin Li, Deok-kee Kim 2010-08-17
7777296 Nano-fuse structural arrangements having blow protection barrier spaced from and surrounding fuse link Jack A. Mandelman 2010-08-17
7772119 Dual liner capping layer interconnect structure Chih-Chao Yang, Keith Kwong Hon Wong 2010-08-10
7767099 Sub-lithographic interconnect patterning using self-assembling polymers Wai-Kin Li 2010-08-03
7749890 Low contact resistance metal contact Keith Kwong Hon Wong, Chih-Chao Yang 2010-07-06