Issued Patents All Time
Showing 51–75 of 104 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8468483 | Method, system and program storage device for performing a parameterized statistical static timing analysis (SSTA) of an integrated circuit taking into account setup and hold margin interdependence | Nathan C. Buck, Brian M. Dreibelbis, John P. Dubuque, Eric A. Foreman, Peter A. Habitz +4 more | 2013-06-18 |
| 8458632 | Efficient slack projection for truncated distributions | Eric A. Foreman, James C. Gregerson, Peter A. Habitz, Jeffrey G. Hemmett, Debjit Sinha +3 more | 2013-06-04 |
| 8418107 | Performing statistical timing analysis with non-separable statistical and deterministic variations | Jeffrey G. Hemmett, Debjit Sinha, Natesan Venkateswaran, Vladimir Zolotov | 2013-04-09 |
| 8359565 | Method and apparatus for generating test patterns for use in at-speed testing | Jinjun Xiong, Vladimir Zolotov | 2013-01-22 |
| 8359563 | Moment-based characterization waveform for static timing analysis | Soroush Abbaspour, Peter Feldmann, David Ling | 2013-01-22 |
| 8340939 | Method and apparatus for selecting paths for use in at-speed testing | Yiyu Shi, Jinjun Xiong, Vladimir Zolotov | 2012-12-25 |
| 8266565 | Ordering of statistical correlated quantities | Jinjun Xiong, Vladimir Zolotov | 2012-09-11 |
| 8176462 | Method and apparatus for generating test patterns for use in at-speed testing | Jinjun Xiong, Vladimir Zolotov | 2012-05-08 |
| 8141012 | Timing closure on multiple selective corners in a single statistical timing run | Nathan C. Buck, Brian M. Dreibelbis, John P. Dubuque, Eric A. Foreman, Peter A. Habitz +4 more | 2012-03-20 |
| 8141025 | Method of performing timing analysis on integrated circuit chips with consideration of process variations | Debjit Sinha, Eric A. Foreman, Peter A. Habitz, Natesan Venkateswaran, Vladimir Zolotov | 2012-03-20 |
| 8122409 | Method and device for selectively adding timing margin in an integrated circuit | David E. Lackey, Paul S. Zuchowski | 2012-02-21 |
| 8122404 | Performing a statistical timing abstraction for a hierarchical timing analysis of VLSI circuits | Debjit Sinha, Adil Bhanji, Barry Lee Dorfman, Kerim Kalafala, Natesan Venkateswaran | 2012-02-21 |
| 8112735 | Affinity-based clustering of vectors for partitioning the columns of a matrix | Kerim Kalafala, Vasant Rao | 2012-02-07 |
| 8104005 | Method and apparatus for efficient incremental statistical timing analysis and optimization | Debjit Sinha, Natesan Venkateswaran, Jinjun Xiong, Vladimir Zolotov | 2012-01-24 |
| 8086976 | Methods for statistical slew propagation during block-based statistical static timing analysis | Jeffrey G. Hemmett, Vladimir Zolotov | 2011-12-27 |
| 8086988 | Chip design and fabrication method optimized for profit | Nathan C. Buck, Howard H. Chen, James Eckhardt, Eric A. Foreman, James C. Gregerson +3 more | 2011-12-27 |
| 8056035 | Method and system for analyzing cross-talk coupling noise events in block-based statistical static timing | Nathan C. Buck, Brian M. Dreibelbis, John P. Dubuque, Eric A. Foreman, Peter A. Habitz +2 more | 2011-11-08 |
| 8015525 | System and method for accommodating non-gaussian and non-linear sources of variation in statistical static timing analysis | Hongliang Chang, Sambasivan Narayan, Vladimir Zolotov | 2011-09-06 |
| 8010921 | System and method for statistical timing analysis of digital circuits | — | 2011-08-30 |
| 7971120 | Method and apparatus for covering a multilayer process space during at-speed testing | Yiyu Shi, Jinjun Xiong, Vladimir Zolotov | 2011-06-28 |
| 7958484 | Affinity-based clustering of vectors for partitioning the columns of a matrix | Kerim Kalafala, Vasant Rao | 2011-06-07 |
| 7886247 | Method and apparatus for statistical path selection for at-speed testing | Hanif Fatemi, Jinjun Xiong, Vladimir Zolotov | 2011-02-08 |
| 7886246 | Methods for identifying failing timing requirements in a digital design | Nathan C. Buck, John P. Dubuque, Eric A. Foreman, Peter A. Habitz | 2011-02-08 |
| 7873925 | Method and apparatus for computing test margins for at-speed testing | Jinjun Xiong, Vladimir Zolotov | 2011-01-18 |
| 7861199 | Method and apparatus for incrementally computing criticality and yield gradient | Jinjun Xiong, Vladimir Zolotov | 2010-12-28 |