Issued Patents All Time
Showing 51–75 of 75 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822627 | Plasma display panel and imaging device using the same | Norihiro Uemura, Keizo Suzuki, Hiroshi Kajiyama, Masayuki Shibata, Yoshimi Kawanami +2 more | 2004-11-23 |
| 6797954 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Hisaya Murakoshi, Masaki Hasegawa, Mari Nozoe, Atsuko Takafuji +4 more | 2004-09-28 |
| 6735735 | Forward error correcting code encoding equipment, forward error correcting code decoding equipment, and transmission apparatus | Masaki Ohira, Masatoshi Shibasaki, Takashi Mori | 2004-05-11 |
| 6608441 | Plasma display panel and method for manufacturing the same | Yasuhiko Kunii, Masayuki Shibata, Yoshimi Kawanami, Kenichi Yamamoto, Atsushi Yokoyama +4 more | 2003-08-19 |
| 6559663 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2003-05-06 |
| 6476390 | Method and apparatus for inspecting integrated circuit pattern using a plurality of charged particle beams | Hisaya Murakoshi, Hiroyuki Shinada, Mari Nozoe, Atsuko Takafuji, Kaoru Umemura +2 more | 2002-11-05 |
| 6329826 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-12-11 |
| 6172363 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-01-09 |
| 5936244 | Electron microscope and electron microscopy method | Yoshio Takahashi, Hiroshi Suzuki, Katsuhiro Kuroda | 1999-08-10 |
| 5698798 | Method and apparatus for dynamic observation of specimen | Makiko Kohno, Shigeyuki Hosoki, Tsuyoshi Hasegawa, Toshio Katsuyama | 1997-12-16 |
| 5666053 | Charged particle beam apparatus for measuring magnetic field | Hiroshi Suzuki, Hiroyuki Shinada, Katsuhiro Kuroda, Yoshio Takahashi, Hideo Saito +1 more | 1997-09-09 |
| 5572122 | Apparatus including a specimen tilt mechanism for measuring electromagnetic field distribution in the specimen using a focused electron beam | Yoshio Takahashi, Masakazu Ichikawa, Shigeyuki Hosoki | 1996-11-05 |
| 5436449 | Transmission electron microscope and method of observing magnetic phenomena using its apparatus | Yoshio Takahashi | 1995-07-25 |
| 5345080 | Method of observing electron microscopic images and an apparatus for carrying out of the same | Masakazu Ichikawa, Hiroyuki Shinada | 1994-09-06 |
| 5298747 | Scanning interference electron microscopy | Masakazu Ichikawa, Masatoshi Takeshita, Toshio Kobayashi | 1994-03-29 |
| 5291145 | Microwave processing equipment | Ken'etsu Yokogawa | 1994-03-01 |
| 5168224 | Detecting method and apparatus of specific substance | Takuya Maruizumi, Yasuhiro Mitsui | 1992-12-01 |
| 5153434 | Electron microscope and method for observing microscopic image | Masakazu Ichikawa, Mikio Ichihashi, Ryo Suzuki, Masatoshi Takeshita | 1992-10-06 |
| 4936252 | Equipment for manufacturing semiconductor devices | Hidekazu Okuhira, Kanji Tsujii, Seiichi Murayama, Akira Shintani, Yasuo Wada | 1990-06-26 |
| 4887037 | Electron spin resonance spectrometer | Kanji Tsujii | 1989-12-12 |
| 4716852 | Apparatus for thin film formation using photo-induced chemical reaction | Kanji Tsujii, Seiichi Murayama | 1988-01-05 |
| 4678536 | Method of photochemical surface treatment | Seiichi Murayama, Kanji Tsujii | 1987-07-07 |
| 4653908 | Grazing incidence reflection spectrometer | Seiichi Murayama, Kanji Tsujii | 1987-03-31 |
| 4643799 | Method of dry etching | Kanji Tsujii, Seiichi Murayama | 1987-02-17 |
| 4615756 | Dry etching apparatus | Kanji Tsujii, Seiichi Murayama | 1986-10-07 |